Manufacturing cycle time reduction using balance control in the semiconductor fabrication line

Young Hoon Lee, Taeheon Kim

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

In semiconductor manufacturing, wafer fabrication is the most complicated and important process, and is composed of several hundred process steps and involves several hundred machines. The productivity of the manufacturing process depends mainly on controlling the balance of WIP (work-in-progress) flow to achieve maximum throughput under short manufacturing cycle times. This paper discusses how to determine the proper WIP level for operations, against which balance status can be measured. Balance measurement can be applied in mathematical modelling for bottleneck scheduling and operations management of the fabrication line. Performances are evaluated through computational experiments to show that balance driven management leads to 15-33% more production in 21% shorter manufacturing cycle time than production driven management.

Original languageEnglish
Pages (from-to)529-540
Number of pages12
JournalProduction Planning and Control
Volume13
Issue number6
DOIs
Publication statusPublished - 2002 Sep

Fingerprint

Semiconductor materials
Fabrication
Productivity
Scheduling
Throughput
Manufacturing
Cycle time reduction
Semiconductors
Experiments
Cycle time
Wafer fabrication
Manufacturing process
Semiconductor manufacturing
Mathematical modeling
Operations management
Experiment

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Strategy and Management
  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering

Cite this

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Manufacturing cycle time reduction using balance control in the semiconductor fabrication line. / Lee, Young Hoon; Kim, Taeheon.

In: Production Planning and Control, Vol. 13, No. 6, 09.2002, p. 529-540.

Research output: Contribution to journalArticle

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