We map the lattice orientation of graphene grains (domains) larger than a centimeter by measuring the orientation of cracks in a WS2 film grown on graphene that had been previously grown by chemical vapor deposition (CVD) on Cu foils. A WO3 film was first deposited on the graphene film and then converted to a WS2 film by CVD sulfurization. The WS2 film was found to contain cracks that, as found by electron diffraction and optical birefringence, are always aligned along the armchair direction of the graphene lattice. We find that this method is significantly advanced compared to any published methods for the analysis of the grain structure, as it provides simultaneous and high-contrast mapping of grain orientation without needing further analysis.
|Number of pages||8|
|Journal||Chemistry of Materials|
|Publication status||Published - 2020 Sept 8|
Bibliographical noteFunding Information:
The authors acknowledge the Pohang Accelerator Laboratory (PAL) for the help in conducting synchrotron experiments. This research was financially supported by a grant (2018R1A2B3008658) of the National Research Foundation (NRF) of Korea, funded by the Ministry of Science and ICT, Korea, and also by the Institute for Basic Science. (IBS-R019-D1; specifically, for M.W., D.L., M.C., Z.L., and R.S.R.) S.J.K. acknowledges funding from the institutional research programs of KIST.
Copyright © 2020 American Chemical Society.
All Science Journal Classification (ASJC) codes
- Chemical Engineering(all)
- Materials Chemistry