Mathematical framework for multi-frequency identification of thin insulating and small conductive inhomogeneities

Habib Ammari, Jin Keun Seo, Tingting Zhang

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


We are aiming to identify the thin insulating inhomogeneities and small conductive inhomogeneities inside an electrically conducting medium by using multi-frequency electrical impedance tomography. The thin insulating inhomogeneities are considered in the form of a tubular neighborhood of a curve and small conductive inhomogeneities are regarded as circular disks. Taking advantage of the frequency dependent behavior of insulating objects, we give a rigorous derivation of the potential along thin insulating objects at various frequencies. Asymptotic formula is given to analyze relationship between inhomogeneities and boundary potential at different frequencies. In numerical simulations, spectroscopic images are provided to visualize the reconstructed admittivity at various frequencies. For the view of both kinds of inhomogeneities, an integrated reconstructed image based on principal component analysis is provided. Phantom experiments are performed by using Swisstom EIT-Pioneer Set.

Original languageEnglish
Article number105001
JournalInverse Problems
Issue number10
Publication statusPublished - 2016 Aug 2

Bibliographical note

Funding Information:
Ammari was supported by the ERC Advanced Grant Project MULTIMOD267184. Seo and Zhang were supported by NRF grant 2015R1A5A1009350.

Publisher Copyright:
© 2016 IOP Publishing Ltd.

All Science Journal Classification (ASJC) codes

  • Theoretical Computer Science
  • Signal Processing
  • Mathematical Physics
  • Computer Science Applications
  • Applied Mathematics


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