Measurement and analysis of the electromagnetic emanations from video display interface

Ho Seong Lee, Jong Gwan Yook, Kyuhong Sim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

The monitor display can be eavesdropped by measuring and analyzing the compromising electromagnetic emanations. These electromagnetic emanations of video display interfaces are generated by electric signals on the display panel or the cable between the computer and the monitor. In this paper, the radiated signals from video display interface of Video Graphics Array (VGA) cable are measured and analyzed. The leaked signals are received by near-field probe connected to the digital oscilloscope. The received signals are reconstructed by signal processing, and reconstructed display is compared with original display.

Original languageEnglish
Title of host publication2015 IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages71-73
Number of pages3
ISBN (Electronic)9781467380997
DOIs
Publication statusPublished - 2016 Jan 14
EventIEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015 - Seoul, Korea, Republic of
Duration: 2015 Dec 142015 Dec 16

Publication series

Name2015 IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015

Other

OtherIEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015
CountryKorea, Republic of
CitySeoul
Period15/12/1415/12/16

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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    Lee, H. S., Yook, J. G., & Sim, K. (2016). Measurement and analysis of the electromagnetic emanations from video display interface. In 2015 IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015 (pp. 71-73). [7383670] (2015 IEEE Electrical Design of Advanced Packaging and Systems Symposium, IEEE EDAPS 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDAPS.2015.7383670