Abstract
A method, believed novel, is demonstrated for determining the strain-optic coefficient profile as well as the residual–stress profile of an optical fiber by use of a modified polariscope combined with a fiberelongation apparatus. Measurement results of the residual–stress and the strain-optic coefficient profiles for Ge–doped and Er–Ge–Al–doped optical fibers are demonstrated with this method.
Original language | English |
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Pages (from-to) | 21-26 |
Number of pages | 6 |
Journal | Applied Optics |
Volume | 41 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2002 Jan 1 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering