A method, believed novel, is demonstrated for determining the strain-optic coefficient profile as well as the residual–stress profile of an optical fiber by use of a modified polariscope combined with a fiberelongation apparatus. Measurement results of the residual–stress and the strain-optic coefficient profiles for Ge–doped and Er–Ge–Al–doped optical fibers are demonstrated with this method.
|Number of pages||6|
|Publication status||Published - 2002 Jan 1|
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering