Measurement of approximately 10 fs XUV pulses from high-order harmonic generation

Zenghu Chang, Kyoungsik Kim, Haiwen Wang, Henry C. Kapteyn, Margaret M. Murnane

Research output: Contribution to conferencePaperpeer-review

Abstract

A cross-correlation measurement which sets an upper limit of approximately 10 fs on the pulse duration of coherent soft X-ray (XUV) harmonics is demonstrated. The high order harmonic pulses are characterized by laser-assisted photo-emission method. The presence of the dressing laser pulse in the Ar jet at the same time as the XUV beam can lead to a simultaneous absorption or emission of a laser photon with photoionization induced by the XUV harmonic beam. The photoelectron energies generated by ionization due to the XUV beam have side band at ±ω.

Original languageEnglish
Pages154
Number of pages1
Publication statusPublished - 1999
EventProceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99) - Baltimore, MD, USA
Duration: 1999 May 231999 May 28

Other

OtherProceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99)
CityBaltimore, MD, USA
Period99/5/2399/5/28

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Measurement of approximately 10 fs XUV pulses from high-order harmonic generation'. Together they form a unique fingerprint.

Cite this