Measurement of approximately 10 fs XUV pulses from high-order harmonic generation

Zenghu Chang, Kyoungsik Kim, Haiwen Wang, Henry C. Kapteyn, Margaret M. Murnane

Research output: Contribution to conferencePaper

Abstract

A cross-correlation measurement which sets an upper limit of approximately 10 fs on the pulse duration of coherent soft X-ray (XUV) harmonics is demonstrated. The high order harmonic pulses are characterized by laser-assisted photo-emission method. The presence of the dressing laser pulse in the Ar jet at the same time as the XUV beam can lead to a simultaneous absorption or emission of a laser photon with photoionization induced by the XUV harmonic beam. The photoelectron energies generated by ionization due to the XUV beam have side band at ±ω.

Original languageEnglish
Number of pages1
Publication statusPublished - 1999 Jan 1
EventProceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99) - Baltimore, MD, USA
Duration: 1999 May 231999 May 28

Other

OtherProceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99)
CityBaltimore, MD, USA
Period99/5/2399/5/28

Fingerprint

harmonic generations
harmonics
pulses
lasers
cross correlation
photoionization
pulse duration
photoelectrons
ionization
photons
x rays
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Chang, Z., Kim, K., Wang, H., Kapteyn, H. C., & Murnane, M. M. (1999). Measurement of approximately 10 fs XUV pulses from high-order harmonic generation. Paper presented at Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99), Baltimore, MD, USA, .
Chang, Zenghu ; Kim, Kyoungsik ; Wang, Haiwen ; Kapteyn, Henry C. ; Murnane, Margaret M. / Measurement of approximately 10 fs XUV pulses from high-order harmonic generation. Paper presented at Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99), Baltimore, MD, USA, .1 p.
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abstract = "A cross-correlation measurement which sets an upper limit of approximately 10 fs on the pulse duration of coherent soft X-ray (XUV) harmonics is demonstrated. The high order harmonic pulses are characterized by laser-assisted photo-emission method. The presence of the dressing laser pulse in the Ar jet at the same time as the XUV beam can lead to a simultaneous absorption or emission of a laser photon with photoionization induced by the XUV harmonic beam. The photoelectron energies generated by ionization due to the XUV beam have side band at ±ω.",
author = "Zenghu Chang and Kyoungsik Kim and Haiwen Wang and Kapteyn, {Henry C.} and Murnane, {Margaret M.}",
year = "1999",
month = "1",
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language = "English",
note = "Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99) ; Conference date: 23-05-1999 Through 28-05-1999",

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Chang, Z, Kim, K, Wang, H, Kapteyn, HC & Murnane, MM 1999, 'Measurement of approximately 10 fs XUV pulses from high-order harmonic generation' Paper presented at Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99), Baltimore, MD, USA, 99/5/23 - 99/5/28, .

Measurement of approximately 10 fs XUV pulses from high-order harmonic generation. / Chang, Zenghu; Kim, Kyoungsik; Wang, Haiwen; Kapteyn, Henry C.; Murnane, Margaret M.

1999. Paper presented at Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99), Baltimore, MD, USA, .

Research output: Contribution to conferencePaper

TY - CONF

T1 - Measurement of approximately 10 fs XUV pulses from high-order harmonic generation

AU - Chang, Zenghu

AU - Kim, Kyoungsik

AU - Wang, Haiwen

AU - Kapteyn, Henry C.

AU - Murnane, Margaret M.

PY - 1999/1/1

Y1 - 1999/1/1

N2 - A cross-correlation measurement which sets an upper limit of approximately 10 fs on the pulse duration of coherent soft X-ray (XUV) harmonics is demonstrated. The high order harmonic pulses are characterized by laser-assisted photo-emission method. The presence of the dressing laser pulse in the Ar jet at the same time as the XUV beam can lead to a simultaneous absorption or emission of a laser photon with photoionization induced by the XUV harmonic beam. The photoelectron energies generated by ionization due to the XUV beam have side band at ±ω.

AB - A cross-correlation measurement which sets an upper limit of approximately 10 fs on the pulse duration of coherent soft X-ray (XUV) harmonics is demonstrated. The high order harmonic pulses are characterized by laser-assisted photo-emission method. The presence of the dressing laser pulse in the Ar jet at the same time as the XUV beam can lead to a simultaneous absorption or emission of a laser photon with photoionization induced by the XUV harmonic beam. The photoelectron energies generated by ionization due to the XUV beam have side band at ±ω.

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Chang Z, Kim K, Wang H, Kapteyn HC, Murnane MM. Measurement of approximately 10 fs XUV pulses from high-order harmonic generation. 1999. Paper presented at Proceedings of the 1999 Quantum Electronics and Laser Science Conference (QELS '99), Baltimore, MD, USA, .