Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser

Kyu Haeng Lee; Wook Rae Cho; Jung Ho Park; Jong Sup Kim; Seung Han Park; Ung Kim

doi:10.1364/OL.19.001116

Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser

Kyu Haeng Lee, Wook Rae Cho, Jung Ho Park, Jong Sup Kim, Seung Han Park, Ung Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

26 Citations (Scopus)

Abstract

Self-defocusing and nonlinear absorption resulting from two-photon-excited free charge carriers were observed in polycrystalline ZnSe at the low power density of ~ 30 MW/cm² by use of the Z-scan technique with nanosecond laser pulses. The total carrier absorption cross section and the variation of refractive index per unit of photoexcited carrier density were estimated to be 0.80 ± 0.10 × 10⁻¹⁸ cm² and 0.60 ± 0.15 × 10⁻²¹ cm³, respectively.

Original language	English
Pages (from-to)	1116-1118
Number of pages	3
Journal	Optics Letters
Volume	19
Issue number	15
DOIs	https://doi.org/10.1364/OL.19.001116
Publication status	Published - 1994 Aug

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

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10.1364/OL.19.001116

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abstract = "Self-defocusing and nonlinear absorption resulting from two-photon-excited free charge carriers were observed in polycrystalline ZnSe at the low power density of ~ 30 MW/cm2 by use of the Z-scan technique with nanosecond laser pulses. The total carrier absorption cross section and the variation of refractive index per unit of photoexcited carrier density were estimated to be 0.80 ± 0.10 × 10−18 cm2 and 0.60 ± 0.15 × 10−21 cm3, respectively.",

author = "Lee, {Kyu Haeng} and Cho, {Wook Rae} and Park, {Jung Ho} and Kim, {Jong Sup} and Park, {Seung Han} and Ung Kim",

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AU - Lee, Kyu Haeng

AU - Cho, Wook Rae

AU - Park, Jung Ho

AU - Kim, Jong Sup

AU - Park, Seung Han

AU - Kim, Ung

PY - 1994/8

Y1 - 1994/8

N2 - Self-defocusing and nonlinear absorption resulting from two-photon-excited free charge carriers were observed in polycrystalline ZnSe at the low power density of ~ 30 MW/cm2 by use of the Z-scan technique with nanosecond laser pulses. The total carrier absorption cross section and the variation of refractive index per unit of photoexcited carrier density were estimated to be 0.80 ± 0.10 × 10−18 cm2 and 0.60 ± 0.15 × 10−21 cm3, respectively.

AB - Self-defocusing and nonlinear absorption resulting from two-photon-excited free charge carriers were observed in polycrystalline ZnSe at the low power density of ~ 30 MW/cm2 by use of the Z-scan technique with nanosecond laser pulses. The total carrier absorption cross section and the variation of refractive index per unit of photoexcited carrier density were estimated to be 0.80 ± 0.10 × 10−18 cm2 and 0.60 ± 0.15 × 10−21 cm3, respectively.

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Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser

Abstract

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