Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser

Kyu Haeng Lee, Wook Rae Cho, Jung Ho Park, Jong Sup Kim, Seung Han Park, Ung Kim

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

Self-defocusing and nonlinear absorption resulting from two-photon-excited free charge carriers were observed in polycrystalline ZnSe at the low power density of ~ 30 MW/cm2 by use of the Z-scan technique with nanosecond laser pulses. The total carrier absorption cross section and the variation of refractive index per unit of photoexcited carrier density were estimated to be 0.80 ± 0.10 × 10−18 cm2 and 0.60 ± 0.15 × 10−21 cm3, respectively.

Original languageEnglish
Pages (from-to)1116-1118
Number of pages3
JournalOptics Letters
Volume19
Issue number15
DOIs
Publication statusPublished - 1994 Jan 1

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defocusing
absorption cross sections
radiant flux density
charge carriers
nonlinearity
refractivity
photons
pulses
lasers

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Lee, Kyu Haeng ; Cho, Wook Rae ; Park, Jung Ho ; Kim, Jong Sup ; Park, Seung Han ; Kim, Ung. / Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser. In: Optics Letters. 1994 ; Vol. 19, No. 15. pp. 1116-1118.
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Measurement of free-carrier nonlinearities in ZnSe based on the Z-scan technique with a nanosecond laser. / Lee, Kyu Haeng; Cho, Wook Rae; Park, Jung Ho; Kim, Jong Sup; Park, Seung Han; Kim, Ung.

In: Optics Letters, Vol. 19, No. 15, 01.01.1994, p. 1116-1118.

Research output: Contribution to journalArticle

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AU - Kim, Ung

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