Measurement of surface profiles of an objective lens by using fine projection moire method

Seong Su Park, Kewseung Lee, Eungjang Lee, Seung Han Park

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a 3-D image measuring technology base to obtain surface profiles of objects using projection moire method, and demonstrate its performance by obtaining surface profiles of a lens with 40μm and 80μm fringe patterns.

Original languageEnglish
Title of host publicationFrontiers in Optics, FiO 2007
PublisherOptical Society of America
ISBN (Print)1557528462, 9781557528469
Publication statusPublished - 2007 Jan 1
EventFrontiers in Optics, FiO 2007 - San Jose, CA, United States
Duration: 2007 Sep 162007 Sep 16

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherFrontiers in Optics, FiO 2007
CountryUnited States
CitySan Jose, CA
Period07/9/1607/9/16

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Park, S. S., Lee, K., Lee, E., & Park, S. H. (2007). Measurement of surface profiles of an objective lens by using fine projection moire method. In Frontiers in Optics, FiO 2007 (Optics InfoBase Conference Papers). Optical Society of America.