Measurement of the inclusive semielectronic [Formula presented] branching fraction

Y. Kubota, M. Lattery, J. K. Nelson, S. Patton, R. Poling, T. Riehle, V. Savinov, R. Wang, M. S. Alam, I. J. Kim, Z. Ling, A. H. Mahmood, J. J. O'Neill, H. Severini, C. R. Sun, S. Timm, F. Wappler, G. Crawford, J. E. Duboscq, R. Fulton & 184 others D. Fujino, K. K. Gan, K. Honscheid, H. Kagan, R. Kass, J. Lee, M. Sung, C. White, R. Wanke, A. Wolf, M. M. Zoeller, X. Fu, B. Nemati, W. R. Ross, P. Skubic, M. Wood, M. Bishai, J. Fast, E. Gerndt, J. W. Hinson, T. Miao, D. H. Miller, M. Modesitt, E. I. Shibata, I. P.J. Shipsey, P. N. Wang, L. Gibbons, S. D. Johnson, Youngjoon Kwon, S. Roberts, E. H. Thorndike, T. E. Coan, J. Dominick, V. Fadeyev, I. Korolkov, M. Lambrecht, S. Sanghera, V. Shelkov, R. Stroynowski, I. Volobouev, G. Wei, M. Artuso, M. Gao, M. Goldberg, D. He, N. Horwitz, S. Kopp, G. C. Moneti, R. Mountain, F. Muheim, Y. Mukhin, S. Playfer, T. Skwarnicki, S. Stone, X. Xing, J. Bartelt, S. E. Csorna, V. Jain, S. Marka, D. Gibaut, K. Kinoshita, P. Pomianowski, S. Schrenk, B. Barish, M. Chadha, S. Chan, D. F. Cowen, G. Eigen, J. S. Miller, C. O'Grady, J. Urheim, A. J. Weinstein, F. Würthwein, D. M. Asner, M. Athanas, D. W. Bliss, W. S. Brower, G. Masek, H. P. Paar, J. Gronberg, C. M. Korte, R. Kutschke, S. Menary, R. J. Morrison, S. Nakanishi, H. N. Nelson, T. K. Nelson, C. Qiao, J. D. Richman, D. Roberts, A. Ryd, H. Tajima, M. S. Witherell, R. Balest, K. Cho, W. T. Ford, M. Lohner, H. Park, P. Rankin, J. Roy, J. G. Smith, J. P. Alexander, C. Bebek, B. E. Berger, K. Berkelman, K. Bloom, T. E. Browder, D. G. Cassel, H. A. Cho, D. M. Coffman, D. S. Crowcroft, M. Dickson, P. S. Drell, D. J. Dumas, R. Ehrlich, R. Elia, P. Gaidarev, B. Gittelman, S. W. Gray, D. L. Hartill, B. K. Heltsley, S. Henderson, C. D. Jones, S. L. Jones, J. Kandaswamy, N. Katayama, P. C. Kim, D. L. Kreinick, T. Lee, Y. Liu, G. S. Ludwig, J. Masui, J. Mevissen, N. B. Mistry, C. R. Ng, E. Nordberg, J. R. Patterson, D. Peterson, D. Riley, A. Soffer, C. Ward, P. Avery, A. Freyberger, K. Lingel, C. Prescott, J. Rodriguez, S. Yang, J. Yelton, G. Brandenburg, D. Cinabro, T. Liu, M. Saulnier, R. Wilson, H. Yamamoto, T. Bergfeld, B. I. Eisenstein, J. Ernst, G. E. Gladding, G. D. Gollin, M. Palmer, M. Selen, J. J. Thaler, K. W. Edwards, K. W. McLean, M. Ogg, A. Bellerive, D. I. Britton, E. R.F. Hyatt, R. Janicek, D. B. MacFarlane, P. M. Patel, B. Spaan, A. J. Sadoff, R. Ammar, P. Baringer, A. Bean, D. Besson, D. Coppage, N. Copty, R. Davis, N. Hancock, S. Kotov, I. Kravchenko, N. Kwak

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Using the angular correlation between the [Formula presented] emitted in a [Formula presented] decay and the [Formula presented] emitted in the subsequent [Formula presented] decay, we have measured the branching fraction for the inclusive semielectronic decay of the [Formula presented] meson to be [Formula presented]. The measurement uses 1.7 [Formula presented] of [Formula presented] collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results we find [Formula presented] and [Formula presented]. The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is also presented.

Original languageEnglish
Pages (from-to)2994-3005
Number of pages12
JournalPhysical Review D - Particles, Fields, Gravitation and Cosmology
Volume54
Issue number5
DOIs
Publication statusPublished - 1996 Jan 1

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decay
angular correlation
mesons
collisions
detectors
electrons

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Physics and Astronomy (miscellaneous)

Cite this

Kubota, Y. ; Lattery, M. ; Nelson, J. K. ; Patton, S. ; Poling, R. ; Riehle, T. ; Savinov, V. ; Wang, R. ; Alam, M. S. ; Kim, I. J. ; Ling, Z. ; Mahmood, A. H. ; O'Neill, J. J. ; Severini, H. ; Sun, C. R. ; Timm, S. ; Wappler, F. ; Crawford, G. ; Duboscq, J. E. ; Fulton, R. ; Fujino, D. ; Gan, K. K. ; Honscheid, K. ; Kagan, H. ; Kass, R. ; Lee, J. ; Sung, M. ; White, C. ; Wanke, R. ; Wolf, A. ; Zoeller, M. M. ; Fu, X. ; Nemati, B. ; Ross, W. R. ; Skubic, P. ; Wood, M. ; Bishai, M. ; Fast, J. ; Gerndt, E. ; Hinson, J. W. ; Miao, T. ; Miller, D. H. ; Modesitt, M. ; Shibata, E. I. ; Shipsey, I. P.J. ; Wang, P. N. ; Gibbons, L. ; Johnson, S. D. ; Kwon, Youngjoon ; Roberts, S. ; Thorndike, E. H. ; Coan, T. E. ; Dominick, J. ; Fadeyev, V. ; Korolkov, I. ; Lambrecht, M. ; Sanghera, S. ; Shelkov, V. ; Stroynowski, R. ; Volobouev, I. ; Wei, G. ; Artuso, M. ; Gao, M. ; Goldberg, M. ; He, D. ; Horwitz, N. ; Kopp, S. ; Moneti, G. C. ; Mountain, R. ; Muheim, F. ; Mukhin, Y. ; Playfer, S. ; Skwarnicki, T. ; Stone, S. ; Xing, X. ; Bartelt, J. ; Csorna, S. E. ; Jain, V. ; Marka, S. ; Gibaut, D. ; Kinoshita, K. ; Pomianowski, P. ; Schrenk, S. ; Barish, B. ; Chadha, M. ; Chan, S. ; Cowen, D. F. ; Eigen, G. ; Miller, J. S. ; O'Grady, C. ; Urheim, J. ; Weinstein, A. J. ; Würthwein, F. ; Asner, D. M. ; Athanas, M. ; Bliss, D. W. ; Brower, W. S. ; Masek, G. ; Paar, H. P. ; Gronberg, J. ; Korte, C. M. ; Kutschke, R. ; Menary, S. ; Morrison, R. J. ; Nakanishi, S. ; Nelson, H. N. ; Nelson, T. K. ; Qiao, C. ; Richman, J. D. ; Roberts, D. ; Ryd, A. ; Tajima, H. ; Witherell, M. S. ; Balest, R. ; Cho, K. ; Ford, W. T. ; Lohner, M. ; Park, H. ; Rankin, P. ; Roy, J. ; Smith, J. G. ; Alexander, J. P. ; Bebek, C. ; Berger, B. E. ; Berkelman, K. ; Bloom, K. ; Browder, T. E. ; Cassel, D. G. ; Cho, H. A. ; Coffman, D. M. ; Crowcroft, D. S. ; Dickson, M. ; Drell, P. S. ; Dumas, D. J. ; Ehrlich, R. ; Elia, R. ; Gaidarev, P. ; Gittelman, B. ; Gray, S. W. ; Hartill, D. L. ; Heltsley, B. K. ; Henderson, S. ; Jones, C. D. ; Jones, S. L. ; Kandaswamy, J. ; Katayama, N. ; Kim, P. C. ; Kreinick, D. L. ; Lee, T. ; Liu, Y. ; Ludwig, G. S. ; Masui, J. ; Mevissen, J. ; Mistry, N. B. ; Ng, C. R. ; Nordberg, E. ; Patterson, J. R. ; Peterson, D. ; Riley, D. ; Soffer, A. ; Ward, C. ; Avery, P. ; Freyberger, A. ; Lingel, K. ; Prescott, C. ; Rodriguez, J. ; Yang, S. ; Yelton, J. ; Brandenburg, G. ; Cinabro, D. ; Liu, T. ; Saulnier, M. ; Wilson, R. ; Yamamoto, H. ; Bergfeld, T. ; Eisenstein, B. I. ; Ernst, J. ; Gladding, G. E. ; Gollin, G. D. ; Palmer, M. ; Selen, M. ; Thaler, J. J. ; Edwards, K. W. ; McLean, K. W. ; Ogg, M. ; Bellerive, A. ; Britton, D. I. ; Hyatt, E. R.F. ; Janicek, R. ; MacFarlane, D. B. ; Patel, P. M. ; Spaan, B. ; Sadoff, A. J. ; Ammar, R. ; Baringer, P. ; Bean, A. ; Besson, D. ; Coppage, D. ; Copty, N. ; Davis, R. ; Hancock, N. ; Kotov, S. ; Kravchenko, I. ; Kwak, N. / Measurement of the inclusive semielectronic [Formula presented] branching fraction. In: Physical Review D - Particles, Fields, Gravitation and Cosmology. 1996 ; Vol. 54, No. 5. pp. 2994-3005.
@article{c00f4368f38944788bf543edca9ff64d,
title = "Measurement of the inclusive semielectronic [Formula presented] branching fraction",
abstract = "Using the angular correlation between the [Formula presented] emitted in a [Formula presented] decay and the [Formula presented] emitted in the subsequent [Formula presented] decay, we have measured the branching fraction for the inclusive semielectronic decay of the [Formula presented] meson to be [Formula presented]. The measurement uses 1.7 [Formula presented] of [Formula presented] collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results we find [Formula presented] and [Formula presented]. The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is also presented.",
author = "Y. Kubota and M. Lattery and Nelson, {J. K.} and S. Patton and R. Poling and T. Riehle and V. Savinov and R. Wang and Alam, {M. S.} and Kim, {I. J.} and Z. Ling and Mahmood, {A. H.} and O'Neill, {J. J.} and H. Severini and Sun, {C. R.} and S. Timm and F. Wappler and G. Crawford and Duboscq, {J. E.} and R. Fulton and D. Fujino and Gan, {K. K.} and K. Honscheid and H. Kagan and R. Kass and J. Lee and M. Sung and C. White and R. Wanke and A. Wolf and Zoeller, {M. M.} and X. Fu and B. Nemati and Ross, {W. R.} and P. Skubic and M. Wood and M. Bishai and J. Fast and E. Gerndt and Hinson, {J. W.} and T. Miao and Miller, {D. H.} and M. Modesitt and Shibata, {E. I.} and Shipsey, {I. P.J.} and Wang, {P. N.} and L. Gibbons and Johnson, {S. D.} and Youngjoon Kwon and S. Roberts and Thorndike, {E. H.} and Coan, {T. E.} and J. Dominick and V. Fadeyev and I. Korolkov and M. Lambrecht and S. Sanghera and V. Shelkov and R. Stroynowski and I. Volobouev and G. Wei and M. Artuso and M. Gao and M. Goldberg and D. He and N. Horwitz and S. Kopp and Moneti, {G. C.} and R. Mountain and F. Muheim and Y. Mukhin and S. Playfer and T. Skwarnicki and S. Stone and X. Xing and J. Bartelt and Csorna, {S. E.} and V. Jain and S. Marka and D. Gibaut and K. Kinoshita and P. Pomianowski and S. Schrenk and B. Barish and M. Chadha and S. Chan and Cowen, {D. F.} and G. Eigen and Miller, {J. S.} and C. O'Grady and J. Urheim and Weinstein, {A. J.} and F. W{\"u}rthwein and Asner, {D. M.} and M. Athanas and Bliss, {D. W.} and Brower, {W. S.} and G. Masek and Paar, {H. P.} and J. Gronberg and Korte, {C. M.} and R. Kutschke and S. Menary and Morrison, {R. J.} and S. Nakanishi and Nelson, {H. N.} and Nelson, {T. K.} and C. Qiao and Richman, {J. D.} and D. Roberts and A. Ryd and H. Tajima and Witherell, {M. S.} and R. Balest and K. Cho and Ford, {W. T.} and M. Lohner and H. Park and P. Rankin and J. Roy and Smith, {J. G.} and Alexander, {J. P.} and C. Bebek and Berger, {B. E.} and K. Berkelman and K. Bloom and Browder, {T. E.} and Cassel, {D. G.} and Cho, {H. A.} and Coffman, {D. M.} and Crowcroft, {D. S.} and M. Dickson and Drell, {P. S.} and Dumas, {D. J.} and R. Ehrlich and R. Elia and P. Gaidarev and B. Gittelman and Gray, {S. W.} and Hartill, {D. L.} and Heltsley, {B. K.} and S. Henderson and Jones, {C. D.} and Jones, {S. L.} and J. Kandaswamy and N. Katayama and Kim, {P. C.} and Kreinick, {D. L.} and T. Lee and Y. Liu and Ludwig, {G. S.} and J. Masui and J. Mevissen and Mistry, {N. B.} and Ng, {C. R.} and E. Nordberg and Patterson, {J. R.} and D. Peterson and D. Riley and A. Soffer and C. Ward and P. Avery and A. Freyberger and K. Lingel and C. Prescott and J. Rodriguez and S. Yang and J. Yelton and G. Brandenburg and D. Cinabro and T. Liu and M. Saulnier and R. Wilson and H. Yamamoto and T. Bergfeld and Eisenstein, {B. I.} and J. Ernst and Gladding, {G. E.} and Gollin, {G. D.} and M. Palmer and M. Selen and Thaler, {J. J.} and Edwards, {K. W.} and McLean, {K. W.} and M. Ogg and A. Bellerive and Britton, {D. I.} and Hyatt, {E. R.F.} and R. Janicek and MacFarlane, {D. B.} and Patel, {P. M.} and B. Spaan and Sadoff, {A. J.} and R. Ammar and P. Baringer and A. Bean and D. Besson and D. Coppage and N. Copty and R. Davis and N. Hancock and S. Kotov and I. Kravchenko and N. Kwak",
year = "1996",
month = "1",
day = "1",
doi = "10.1103/PhysRevD.54.2994",
language = "English",
volume = "54",
pages = "2994--3005",
journal = "Physical review D: Particles and fields",
issn = "1550-7998",
publisher = "American Physical Society",
number = "5",

}

Kubota, Y, Lattery, M, Nelson, JK, Patton, S, Poling, R, Riehle, T, Savinov, V, Wang, R, Alam, MS, Kim, IJ, Ling, Z, Mahmood, AH, O'Neill, JJ, Severini, H, Sun, CR, Timm, S, Wappler, F, Crawford, G, Duboscq, JE, Fulton, R, Fujino, D, Gan, KK, Honscheid, K, Kagan, H, Kass, R, Lee, J, Sung, M, White, C, Wanke, R, Wolf, A, Zoeller, MM, Fu, X, Nemati, B, Ross, WR, Skubic, P, Wood, M, Bishai, M, Fast, J, Gerndt, E, Hinson, JW, Miao, T, Miller, DH, Modesitt, M, Shibata, EI, Shipsey, IPJ, Wang, PN, Gibbons, L, Johnson, SD, Kwon, Y, Roberts, S, Thorndike, EH, Coan, TE, Dominick, J, Fadeyev, V, Korolkov, I, Lambrecht, M, Sanghera, S, Shelkov, V, Stroynowski, R, Volobouev, I, Wei, G, Artuso, M, Gao, M, Goldberg, M, He, D, Horwitz, N, Kopp, S, Moneti, GC, Mountain, R, Muheim, F, Mukhin, Y, Playfer, S, Skwarnicki, T, Stone, S, Xing, X, Bartelt, J, Csorna, SE, Jain, V, Marka, S, Gibaut, D, Kinoshita, K, Pomianowski, P, Schrenk, S, Barish, B, Chadha, M, Chan, S, Cowen, DF, Eigen, G, Miller, JS, O'Grady, C, Urheim, J, Weinstein, AJ, Würthwein, F, Asner, DM, Athanas, M, Bliss, DW, Brower, WS, Masek, G, Paar, HP, Gronberg, J, Korte, CM, Kutschke, R, Menary, S, Morrison, RJ, Nakanishi, S, Nelson, HN, Nelson, TK, Qiao, C, Richman, JD, Roberts, D, Ryd, A, Tajima, H, Witherell, MS, Balest, R, Cho, K, Ford, WT, Lohner, M, Park, H, Rankin, P, Roy, J, Smith, JG, Alexander, JP, Bebek, C, Berger, BE, Berkelman, K, Bloom, K, Browder, TE, Cassel, DG, Cho, HA, Coffman, DM, Crowcroft, DS, Dickson, M, Drell, PS, Dumas, DJ, Ehrlich, R, Elia, R, Gaidarev, P, Gittelman, B, Gray, SW, Hartill, DL, Heltsley, BK, Henderson, S, Jones, CD, Jones, SL, Kandaswamy, J, Katayama, N, Kim, PC, Kreinick, DL, Lee, T, Liu, Y, Ludwig, GS, Masui, J, Mevissen, J, Mistry, NB, Ng, CR, Nordberg, E, Patterson, JR, Peterson, D, Riley, D, Soffer, A, Ward, C, Avery, P, Freyberger, A, Lingel, K, Prescott, C, Rodriguez, J, Yang, S, Yelton, J, Brandenburg, G, Cinabro, D, Liu, T, Saulnier, M, Wilson, R, Yamamoto, H, Bergfeld, T, Eisenstein, BI, Ernst, J, Gladding, GE, Gollin, GD, Palmer, M, Selen, M, Thaler, JJ, Edwards, KW, McLean, KW, Ogg, M, Bellerive, A, Britton, DI, Hyatt, ERF, Janicek, R, MacFarlane, DB, Patel, PM, Spaan, B, Sadoff, AJ, Ammar, R, Baringer, P, Bean, A, Besson, D, Coppage, D, Copty, N, Davis, R, Hancock, N, Kotov, S, Kravchenko, I & Kwak, N 1996, 'Measurement of the inclusive semielectronic [Formula presented] branching fraction', Physical Review D - Particles, Fields, Gravitation and Cosmology, vol. 54, no. 5, pp. 2994-3005. https://doi.org/10.1103/PhysRevD.54.2994

Measurement of the inclusive semielectronic [Formula presented] branching fraction. / Kubota, Y.; Lattery, M.; Nelson, J. K.; Patton, S.; Poling, R.; Riehle, T.; Savinov, V.; Wang, R.; Alam, M. S.; Kim, I. J.; Ling, Z.; Mahmood, A. H.; O'Neill, J. J.; Severini, H.; Sun, C. R.; Timm, S.; Wappler, F.; Crawford, G.; Duboscq, J. E.; Fulton, R.; Fujino, D.; Gan, K. K.; Honscheid, K.; Kagan, H.; Kass, R.; Lee, J.; Sung, M.; White, C.; Wanke, R.; Wolf, A.; Zoeller, M. M.; Fu, X.; Nemati, B.; Ross, W. R.; Skubic, P.; Wood, M.; Bishai, M.; Fast, J.; Gerndt, E.; Hinson, J. W.; Miao, T.; Miller, D. H.; Modesitt, M.; Shibata, E. I.; Shipsey, I. P.J.; Wang, P. N.; Gibbons, L.; Johnson, S. D.; Kwon, Youngjoon; Roberts, S.; Thorndike, E. H.; Coan, T. E.; Dominick, J.; Fadeyev, V.; Korolkov, I.; Lambrecht, M.; Sanghera, S.; Shelkov, V.; Stroynowski, R.; Volobouev, I.; Wei, G.; Artuso, M.; Gao, M.; Goldberg, M.; He, D.; Horwitz, N.; Kopp, S.; Moneti, G. C.; Mountain, R.; Muheim, F.; Mukhin, Y.; Playfer, S.; Skwarnicki, T.; Stone, S.; Xing, X.; Bartelt, J.; Csorna, S. E.; Jain, V.; Marka, S.; Gibaut, D.; Kinoshita, K.; Pomianowski, P.; Schrenk, S.; Barish, B.; Chadha, M.; Chan, S.; Cowen, D. F.; Eigen, G.; Miller, J. S.; O'Grady, C.; Urheim, J.; Weinstein, A. J.; Würthwein, F.; Asner, D. M.; Athanas, M.; Bliss, D. W.; Brower, W. S.; Masek, G.; Paar, H. P.; Gronberg, J.; Korte, C. M.; Kutschke, R.; Menary, S.; Morrison, R. J.; Nakanishi, S.; Nelson, H. N.; Nelson, T. K.; Qiao, C.; Richman, J. D.; Roberts, D.; Ryd, A.; Tajima, H.; Witherell, M. S.; Balest, R.; Cho, K.; Ford, W. T.; Lohner, M.; Park, H.; Rankin, P.; Roy, J.; Smith, J. G.; Alexander, J. P.; Bebek, C.; Berger, B. E.; Berkelman, K.; Bloom, K.; Browder, T. E.; Cassel, D. G.; Cho, H. A.; Coffman, D. M.; Crowcroft, D. S.; Dickson, M.; Drell, P. S.; Dumas, D. J.; Ehrlich, R.; Elia, R.; Gaidarev, P.; Gittelman, B.; Gray, S. W.; Hartill, D. L.; Heltsley, B. K.; Henderson, S.; Jones, C. D.; Jones, S. L.; Kandaswamy, J.; Katayama, N.; Kim, P. C.; Kreinick, D. L.; Lee, T.; Liu, Y.; Ludwig, G. S.; Masui, J.; Mevissen, J.; Mistry, N. B.; Ng, C. R.; Nordberg, E.; Patterson, J. R.; Peterson, D.; Riley, D.; Soffer, A.; Ward, C.; Avery, P.; Freyberger, A.; Lingel, K.; Prescott, C.; Rodriguez, J.; Yang, S.; Yelton, J.; Brandenburg, G.; Cinabro, D.; Liu, T.; Saulnier, M.; Wilson, R.; Yamamoto, H.; Bergfeld, T.; Eisenstein, B. I.; Ernst, J.; Gladding, G. E.; Gollin, G. D.; Palmer, M.; Selen, M.; Thaler, J. J.; Edwards, K. W.; McLean, K. W.; Ogg, M.; Bellerive, A.; Britton, D. I.; Hyatt, E. R.F.; Janicek, R.; MacFarlane, D. B.; Patel, P. M.; Spaan, B.; Sadoff, A. J.; Ammar, R.; Baringer, P.; Bean, A.; Besson, D.; Coppage, D.; Copty, N.; Davis, R.; Hancock, N.; Kotov, S.; Kravchenko, I.; Kwak, N.

In: Physical Review D - Particles, Fields, Gravitation and Cosmology, Vol. 54, No. 5, 01.01.1996, p. 2994-3005.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Measurement of the inclusive semielectronic [Formula presented] branching fraction

AU - Kubota, Y.

AU - Lattery, M.

AU - Nelson, J. K.

AU - Patton, S.

AU - Poling, R.

AU - Riehle, T.

AU - Savinov, V.

AU - Wang, R.

AU - Alam, M. S.

AU - Kim, I. J.

AU - Ling, Z.

AU - Mahmood, A. H.

AU - O'Neill, J. J.

AU - Severini, H.

AU - Sun, C. R.

AU - Timm, S.

AU - Wappler, F.

AU - Crawford, G.

AU - Duboscq, J. E.

AU - Fulton, R.

AU - Fujino, D.

AU - Gan, K. K.

AU - Honscheid, K.

AU - Kagan, H.

AU - Kass, R.

AU - Lee, J.

AU - Sung, M.

AU - White, C.

AU - Wanke, R.

AU - Wolf, A.

AU - Zoeller, M. M.

AU - Fu, X.

AU - Nemati, B.

AU - Ross, W. R.

AU - Skubic, P.

AU - Wood, M.

AU - Bishai, M.

AU - Fast, J.

AU - Gerndt, E.

AU - Hinson, J. W.

AU - Miao, T.

AU - Miller, D. H.

AU - Modesitt, M.

AU - Shibata, E. I.

AU - Shipsey, I. P.J.

AU - Wang, P. N.

AU - Gibbons, L.

AU - Johnson, S. D.

AU - Kwon, Youngjoon

AU - Roberts, S.

AU - Thorndike, E. H.

AU - Coan, T. E.

AU - Dominick, J.

AU - Fadeyev, V.

AU - Korolkov, I.

AU - Lambrecht, M.

AU - Sanghera, S.

AU - Shelkov, V.

AU - Stroynowski, R.

AU - Volobouev, I.

AU - Wei, G.

AU - Artuso, M.

AU - Gao, M.

AU - Goldberg, M.

AU - He, D.

AU - Horwitz, N.

AU - Kopp, S.

AU - Moneti, G. C.

AU - Mountain, R.

AU - Muheim, F.

AU - Mukhin, Y.

AU - Playfer, S.

AU - Skwarnicki, T.

AU - Stone, S.

AU - Xing, X.

AU - Bartelt, J.

AU - Csorna, S. E.

AU - Jain, V.

AU - Marka, S.

AU - Gibaut, D.

AU - Kinoshita, K.

AU - Pomianowski, P.

AU - Schrenk, S.

AU - Barish, B.

AU - Chadha, M.

AU - Chan, S.

AU - Cowen, D. F.

AU - Eigen, G.

AU - Miller, J. S.

AU - O'Grady, C.

AU - Urheim, J.

AU - Weinstein, A. J.

AU - Würthwein, F.

AU - Asner, D. M.

AU - Athanas, M.

AU - Bliss, D. W.

AU - Brower, W. S.

AU - Masek, G.

AU - Paar, H. P.

AU - Gronberg, J.

AU - Korte, C. M.

AU - Kutschke, R.

AU - Menary, S.

AU - Morrison, R. J.

AU - Nakanishi, S.

AU - Nelson, H. N.

AU - Nelson, T. K.

AU - Qiao, C.

AU - Richman, J. D.

AU - Roberts, D.

AU - Ryd, A.

AU - Tajima, H.

AU - Witherell, M. S.

AU - Balest, R.

AU - Cho, K.

AU - Ford, W. T.

AU - Lohner, M.

AU - Park, H.

AU - Rankin, P.

AU - Roy, J.

AU - Smith, J. G.

AU - Alexander, J. P.

AU - Bebek, C.

AU - Berger, B. E.

AU - Berkelman, K.

AU - Bloom, K.

AU - Browder, T. E.

AU - Cassel, D. G.

AU - Cho, H. A.

AU - Coffman, D. M.

AU - Crowcroft, D. S.

AU - Dickson, M.

AU - Drell, P. S.

AU - Dumas, D. J.

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PY - 1996/1/1

Y1 - 1996/1/1

N2 - Using the angular correlation between the [Formula presented] emitted in a [Formula presented] decay and the [Formula presented] emitted in the subsequent [Formula presented] decay, we have measured the branching fraction for the inclusive semielectronic decay of the [Formula presented] meson to be [Formula presented]. The measurement uses 1.7 [Formula presented] of [Formula presented] collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results we find [Formula presented] and [Formula presented]. The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is also presented.

AB - Using the angular correlation between the [Formula presented] emitted in a [Formula presented] decay and the [Formula presented] emitted in the subsequent [Formula presented] decay, we have measured the branching fraction for the inclusive semielectronic decay of the [Formula presented] meson to be [Formula presented]. The measurement uses 1.7 [Formula presented] of [Formula presented] collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results we find [Formula presented] and [Formula presented]. The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is also presented.

UR - http://www.scopus.com/inward/record.url?scp=0039950127&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0039950127&partnerID=8YFLogxK

U2 - 10.1103/PhysRevD.54.2994

DO - 10.1103/PhysRevD.54.2994

M3 - Article

VL - 54

SP - 2994

EP - 3005

JO - Physical review D: Particles and fields

JF - Physical review D: Particles and fields

SN - 1550-7998

IS - 5

ER -