Measurement of thermal conductivity of Bi2Te3 nanowire using high-vacuum scanning thermal wave microscopy

Kyungbae Park, Gwangseok Hwang, Hayeong Kim, Jungwon Kim, Woochul Kim, Sungjin Kim, Ohmyoung Kwon

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

With the increasing application of nanomaterials in the development of high-efficiency thermoelectric energy conversion materials and electronic devices, the measurement of the intrinsic thermal conductivity of nanomaterials in the form of nanowires and nanofilms has become very important. However, the current widely used methods for measuring thermal conductivity have difficulties in eliminating the influence of interfacial thermal resistance (ITR) during the measurement. In this study, by using high-vacuum scanning thermal wave microscopy (HV-STWM), we propose a quantitative method for measuring the thermal conductivity of nanomaterials. By measuring the local phase lag of high-frequency (>10 kHz) thermal waves passing through a nanomaterial in a high-vacuum environment, HV-STWM eliminates the measurement errors due to ITR and the distortion due to heat transfer through air. By using HV-STWM, we measure the thermal conductivity of a Bi2Te3 nanowire. Because HV-STWM is quantitatively accurate and its specimen preparation is easier than in the thermal bridge method, we believe that HV-STWM will be widely used for measuring the thermal properties of various types of nanomaterials.

Original languageEnglish
Article number071907
JournalApplied Physics Letters
Volume108
Issue number7
DOIs
Publication statusPublished - 2016 Feb 15

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high vacuum
nanowires
thermal conductivity
microscopy
scanning
thermal resistance
energy conversion
time lag
thermodynamic properties
heat transfer
preparation
air
electronics

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Park, Kyungbae ; Hwang, Gwangseok ; Kim, Hayeong ; Kim, Jungwon ; Kim, Woochul ; Kim, Sungjin ; Kwon, Ohmyoung. / Measurement of thermal conductivity of Bi2Te3 nanowire using high-vacuum scanning thermal wave microscopy. In: Applied Physics Letters. 2016 ; Vol. 108, No. 7.
@article{21824d7a7c4e4075b7f6890a555ade58,
title = "Measurement of thermal conductivity of Bi2Te3 nanowire using high-vacuum scanning thermal wave microscopy",
abstract = "With the increasing application of nanomaterials in the development of high-efficiency thermoelectric energy conversion materials and electronic devices, the measurement of the intrinsic thermal conductivity of nanomaterials in the form of nanowires and nanofilms has become very important. However, the current widely used methods for measuring thermal conductivity have difficulties in eliminating the influence of interfacial thermal resistance (ITR) during the measurement. In this study, by using high-vacuum scanning thermal wave microscopy (HV-STWM), we propose a quantitative method for measuring the thermal conductivity of nanomaterials. By measuring the local phase lag of high-frequency (>10 kHz) thermal waves passing through a nanomaterial in a high-vacuum environment, HV-STWM eliminates the measurement errors due to ITR and the distortion due to heat transfer through air. By using HV-STWM, we measure the thermal conductivity of a Bi2Te3 nanowire. Because HV-STWM is quantitatively accurate and its specimen preparation is easier than in the thermal bridge method, we believe that HV-STWM will be widely used for measuring the thermal properties of various types of nanomaterials.",
author = "Kyungbae Park and Gwangseok Hwang and Hayeong Kim and Jungwon Kim and Woochul Kim and Sungjin Kim and Ohmyoung Kwon",
year = "2016",
month = "2",
day = "15",
doi = "10.1063/1.4942098",
language = "English",
volume = "108",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "7",

}

Measurement of thermal conductivity of Bi2Te3 nanowire using high-vacuum scanning thermal wave microscopy. / Park, Kyungbae; Hwang, Gwangseok; Kim, Hayeong; Kim, Jungwon; Kim, Woochul; Kim, Sungjin; Kwon, Ohmyoung.

In: Applied Physics Letters, Vol. 108, No. 7, 071907, 15.02.2016.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Measurement of thermal conductivity of Bi2Te3 nanowire using high-vacuum scanning thermal wave microscopy

AU - Park, Kyungbae

AU - Hwang, Gwangseok

AU - Kim, Hayeong

AU - Kim, Jungwon

AU - Kim, Woochul

AU - Kim, Sungjin

AU - Kwon, Ohmyoung

PY - 2016/2/15

Y1 - 2016/2/15

N2 - With the increasing application of nanomaterials in the development of high-efficiency thermoelectric energy conversion materials and electronic devices, the measurement of the intrinsic thermal conductivity of nanomaterials in the form of nanowires and nanofilms has become very important. However, the current widely used methods for measuring thermal conductivity have difficulties in eliminating the influence of interfacial thermal resistance (ITR) during the measurement. In this study, by using high-vacuum scanning thermal wave microscopy (HV-STWM), we propose a quantitative method for measuring the thermal conductivity of nanomaterials. By measuring the local phase lag of high-frequency (>10 kHz) thermal waves passing through a nanomaterial in a high-vacuum environment, HV-STWM eliminates the measurement errors due to ITR and the distortion due to heat transfer through air. By using HV-STWM, we measure the thermal conductivity of a Bi2Te3 nanowire. Because HV-STWM is quantitatively accurate and its specimen preparation is easier than in the thermal bridge method, we believe that HV-STWM will be widely used for measuring the thermal properties of various types of nanomaterials.

AB - With the increasing application of nanomaterials in the development of high-efficiency thermoelectric energy conversion materials and electronic devices, the measurement of the intrinsic thermal conductivity of nanomaterials in the form of nanowires and nanofilms has become very important. However, the current widely used methods for measuring thermal conductivity have difficulties in eliminating the influence of interfacial thermal resistance (ITR) during the measurement. In this study, by using high-vacuum scanning thermal wave microscopy (HV-STWM), we propose a quantitative method for measuring the thermal conductivity of nanomaterials. By measuring the local phase lag of high-frequency (>10 kHz) thermal waves passing through a nanomaterial in a high-vacuum environment, HV-STWM eliminates the measurement errors due to ITR and the distortion due to heat transfer through air. By using HV-STWM, we measure the thermal conductivity of a Bi2Te3 nanowire. Because HV-STWM is quantitatively accurate and its specimen preparation is easier than in the thermal bridge method, we believe that HV-STWM will be widely used for measuring the thermal properties of various types of nanomaterials.

UR - http://www.scopus.com/inward/record.url?scp=84959218576&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84959218576&partnerID=8YFLogxK

U2 - 10.1063/1.4942098

DO - 10.1063/1.4942098

M3 - Article

AN - SCOPUS:84959218576

VL - 108

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 7

M1 - 071907

ER -