Measurement of two-dimensional distribution of pure axial force in active polishing

Sug-Whan Kim, David Walker

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We present a new technique of real-time measurement for the pure axial force distribution exerted by a full size active polishing tool on large aspheric surfaces. The technique uses an array of custom developed flat line load cells incorporating semiconductor strain gauges that can withstand the large shear forces in polishing. Design, manufacture and characterization of the force sensor array and its instrumentation to the active polisher are described. In particular, thermal characterization of the sensors proved that the temperature change by a few degrees required for a polishing tool has negligible effects on sensitivity and zero-point offset. Effects of non-axial force components were compensated with four independent half-bridge signals inside a sensor unit. This was further removed with a gap condition between the sensor array and the structural membrane, of which the latter functions as a point of pushing and pulling the polishing lap. The sensor array shows a potential usage in detecting and controlling the non-axial force components in operation. The real-time graphical map of axial polishing force generated by the sensor array improved the polishing efficiency by at least 30% compared to the traditional polishing technique.

Original languageEnglish
Pages (from-to)1976-1982
Number of pages7
JournalMeasurement Science and Technology
Volume12
Issue number11
DOIs
Publication statusPublished - 2001 Jan 1

Fingerprint

Polishing
polishing
Sensor Array
Sensor arrays
sensors
Aspheric Surface
Real-time
force distribution
Force Sensor
Sensor
Strain Gauge
Zero Point
pushing
strain gages
Sensors
pulling
Strain gages
Time measurement
Instrumentation
Semiconductors

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Applied Mathematics

Cite this

@article{a0e83145718a4c28994df53dd00dabf1,
title = "Measurement of two-dimensional distribution of pure axial force in active polishing",
abstract = "We present a new technique of real-time measurement for the pure axial force distribution exerted by a full size active polishing tool on large aspheric surfaces. The technique uses an array of custom developed flat line load cells incorporating semiconductor strain gauges that can withstand the large shear forces in polishing. Design, manufacture and characterization of the force sensor array and its instrumentation to the active polisher are described. In particular, thermal characterization of the sensors proved that the temperature change by a few degrees required for a polishing tool has negligible effects on sensitivity and zero-point offset. Effects of non-axial force components were compensated with four independent half-bridge signals inside a sensor unit. This was further removed with a gap condition between the sensor array and the structural membrane, of which the latter functions as a point of pushing and pulling the polishing lap. The sensor array shows a potential usage in detecting and controlling the non-axial force components in operation. The real-time graphical map of axial polishing force generated by the sensor array improved the polishing efficiency by at least 30{\%} compared to the traditional polishing technique.",
author = "Sug-Whan Kim and David Walker",
year = "2001",
month = "1",
day = "1",
doi = "10.1088/0957-0233/12/11/329",
language = "English",
volume = "12",
pages = "1976--1982",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "11",

}

Measurement of two-dimensional distribution of pure axial force in active polishing. / Kim, Sug-Whan; Walker, David.

In: Measurement Science and Technology, Vol. 12, No. 11, 01.01.2001, p. 1976-1982.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Measurement of two-dimensional distribution of pure axial force in active polishing

AU - Kim, Sug-Whan

AU - Walker, David

PY - 2001/1/1

Y1 - 2001/1/1

N2 - We present a new technique of real-time measurement for the pure axial force distribution exerted by a full size active polishing tool on large aspheric surfaces. The technique uses an array of custom developed flat line load cells incorporating semiconductor strain gauges that can withstand the large shear forces in polishing. Design, manufacture and characterization of the force sensor array and its instrumentation to the active polisher are described. In particular, thermal characterization of the sensors proved that the temperature change by a few degrees required for a polishing tool has negligible effects on sensitivity and zero-point offset. Effects of non-axial force components were compensated with four independent half-bridge signals inside a sensor unit. This was further removed with a gap condition between the sensor array and the structural membrane, of which the latter functions as a point of pushing and pulling the polishing lap. The sensor array shows a potential usage in detecting and controlling the non-axial force components in operation. The real-time graphical map of axial polishing force generated by the sensor array improved the polishing efficiency by at least 30% compared to the traditional polishing technique.

AB - We present a new technique of real-time measurement for the pure axial force distribution exerted by a full size active polishing tool on large aspheric surfaces. The technique uses an array of custom developed flat line load cells incorporating semiconductor strain gauges that can withstand the large shear forces in polishing. Design, manufacture and characterization of the force sensor array and its instrumentation to the active polisher are described. In particular, thermal characterization of the sensors proved that the temperature change by a few degrees required for a polishing tool has negligible effects on sensitivity and zero-point offset. Effects of non-axial force components were compensated with four independent half-bridge signals inside a sensor unit. This was further removed with a gap condition between the sensor array and the structural membrane, of which the latter functions as a point of pushing and pulling the polishing lap. The sensor array shows a potential usage in detecting and controlling the non-axial force components in operation. The real-time graphical map of axial polishing force generated by the sensor array improved the polishing efficiency by at least 30% compared to the traditional polishing technique.

UR - http://www.scopus.com/inward/record.url?scp=0035504534&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035504534&partnerID=8YFLogxK

U2 - 10.1088/0957-0233/12/11/329

DO - 10.1088/0957-0233/12/11/329

M3 - Article

AN - SCOPUS:0035504534

VL - 12

SP - 1976

EP - 1982

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 11

ER -