Mechanisms for low on-state current of Ge (SiGe) nMOSFETs: A comparative study on gate stack, resistance, and orientation-dependent effective masses

J. Oh, I. Ok, C. Y. Kang, M. Jamil, S. H. Lee, W. Y. Loh, J. Huang, B. Sassman, L. Smith, S. Parthasarathy, B. E. Coss, W. H. Choi, H. D. Lee, M. Cho, S. K. Banerjee, P. Majhi, P. D. Kirsch, H. H. Tseng, R. Jammy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

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Engineering & Materials Science