Memory-like Defect Diagnosis for CMOL FPGAs

Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using reconfiguration due to its high defect rate. To bypass defect elements, accurate defect diagnosis is important for circuit configuration. CMOL FPGAs are circuit structures combining advantages of CMOS and nanotechnology. In this paper, an accurate defect diagnosis method for CMOL FPGAs using an operation similar to the read of CMOL memory are proposed.

Original languageEnglish
Title of host publicationProceedings - International SoC Design Conference, ISOCC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages139-140
Number of pages2
ISBN (Electronic)9781728183312
DOIs
Publication statusPublished - 2020 Oct 21
Event17th International System-on-Chip Design Conference, ISOCC 2020 - Yeosu, Korea, Republic of
Duration: 2020 Oct 212020 Oct 24

Publication series

NameProceedings - International SoC Design Conference, ISOCC 2020

Conference

Conference17th International System-on-Chip Design Conference, ISOCC 2020
CountryKorea, Republic of
CityYeosu
Period20/10/2120/10/24

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2019R1A2C3011079).

Publisher Copyright:
© 2020 IEEE.

All Science Journal Classification (ASJC) codes

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Instrumentation
  • Artificial Intelligence
  • Hardware and Architecture

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