MEMS-based particle detection system for measuring airborne ultrafine particles

Hong Lae Kim, Jangseop Han, Sang Myun Lee, Hong Beom Kwon, Jungho Hwang, Yong-Jun Kim

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A MEMS-based particle detection system which includes a particle processing chip and electronic circuits was developed for low-cost and ubiquitous monitoring of airborne ultrafine particles. The detection system consists of particle classification, charging, precipitation, and sensing sections. Particles with different sizes enter the ultrafine particle processing chip and are separated according to their sizes in the classification section. Size-classified particles are charged in the charging section. Then, the mean size and particle concentrations are determined in the precipitation and sensing sections. The particle classification, charging, and precipitation sections were integrated on a single chip using MEMS and microfluidic technologies. The particle sensing section was realized using a metal filter connected to a high-precision electrometer. The characteristics of each section were first analyzed, and the proposed particle detection system was then compared with standard commercially available instruments. The calculated particle number concentrations correspond to the results measured by commercially available instruments. The proposed particle detection system can be applied for monitoring of ultrafine particles with size range of 20–300 nm (20–130 nm particle mean diameter) and concentration range of 320–106 particles/cm3.

Original languageEnglish
Pages (from-to)235-244
Number of pages10
JournalSensors and Actuators, A: Physical
Volume283
DOIs
Publication statusPublished - 2018 Nov 1

Fingerprint

microelectromechanical systems
MEMS
Electrometers
Monitoring
Charged particles
Processing
Microfluidics
Metals
Particle size
Networks (circuits)
charging
chips
Ultrafine
Costs
electrometers
charged particles

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Electrical and Electronic Engineering

Cite this

Kim, Hong Lae ; Han, Jangseop ; Lee, Sang Myun ; Kwon, Hong Beom ; Hwang, Jungho ; Kim, Yong-Jun. / MEMS-based particle detection system for measuring airborne ultrafine particles. In: Sensors and Actuators, A: Physical. 2018 ; Vol. 283. pp. 235-244.
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MEMS-based particle detection system for measuring airborne ultrafine particles. / Kim, Hong Lae; Han, Jangseop; Lee, Sang Myun; Kwon, Hong Beom; Hwang, Jungho; Kim, Yong-Jun.

In: Sensors and Actuators, A: Physical, Vol. 283, 01.11.2018, p. 235-244.

Research output: Contribution to journalArticle

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