Metal ion sensing solution containing double crossover DNA

Byeongho Park, Sreekantha R. Dugasani, Youngho Cho, Juyeong Oh, Chulki Kim, Min Ah Seo, Taikjin Lee, Young Miin Jhon, Deok Ha Woo, Seok Lee, Seong Chan Jun, Sung Ha Park, Jae Hun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The current study describes metal ion sensing with double crossover DNAs (DX1 and DX2), artificially designed as a platform of doping. The sample for sensing is prepared by a facile annealing method to grow the DXs lattice on a silicon/silicon oxide. Adding and incubating metal ion solution with the sensor substrate into the micro-tube lead the optical property change. Photoluminescence (PL) is employed for detecting the concentration of metal ion in the specimen. We investigated PL emission for sensor application with the divalent copper. In the range from 400 to 650 nm, the PL features of samples provide significantly different peak positions with excitation and emission detection. Metal ions contribute to modify the optical characteristics of DX with structural and functional change, which results from the intercalation of them into hydrogen bonding positioned at the center of double helix. The PL intensity is decreased gradually after doping copper ion in the DX tile on the substrate.

Original languageEnglish
Title of host publicationFifth Asia-Pacific Optical Sensors Conference, APOS 2015
EditorsByoungho Lee, Yunjiang Rao, Sang Bae Lee
PublisherSPIE
ISBN (Electronic)9781628418651
DOIs
Publication statusPublished - 2015 Jan 1
Event5th Asia-Pacific Optical Sensors Conference, APOS 2015 - Jeju, Korea, Republic of
Duration: 2015 May 202015 May 22

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9655
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

Other5th Asia-Pacific Optical Sensors Conference, APOS 2015
CountryKorea, Republic of
CityJeju
Period15/5/2015/5/22

Fingerprint

Photoluminescence
Metal ions
Crossover
metal ions
crossovers
DNA
Sensing
deoxyribonucleic acid
Metals
photoluminescence
Copper
Silicon
Substrate
Doping (additives)
copper
Sensor
sensors
tiles
Silicon oxides
Sensors

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Park, B., Dugasani, S. R., Cho, Y., Oh, J., Kim, C., Seo, M. A., ... Kim, J. H. (2015). Metal ion sensing solution containing double crossover DNA. In B. Lee, Y. Rao, & S. B. Lee (Eds.), Fifth Asia-Pacific Optical Sensors Conference, APOS 2015 [96553A] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9655). SPIE. https://doi.org/10.1117/12.2184390
Park, Byeongho ; Dugasani, Sreekantha R. ; Cho, Youngho ; Oh, Juyeong ; Kim, Chulki ; Seo, Min Ah ; Lee, Taikjin ; Jhon, Young Miin ; Woo, Deok Ha ; Lee, Seok ; Jun, Seong Chan ; Park, Sung Ha ; Kim, Jae Hun. / Metal ion sensing solution containing double crossover DNA. Fifth Asia-Pacific Optical Sensors Conference, APOS 2015. editor / Byoungho Lee ; Yunjiang Rao ; Sang Bae Lee. SPIE, 2015. (Proceedings of SPIE - The International Society for Optical Engineering).
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abstract = "The current study describes metal ion sensing with double crossover DNAs (DX1 and DX2), artificially designed as a platform of doping. The sample for sensing is prepared by a facile annealing method to grow the DXs lattice on a silicon/silicon oxide. Adding and incubating metal ion solution with the sensor substrate into the micro-tube lead the optical property change. Photoluminescence (PL) is employed for detecting the concentration of metal ion in the specimen. We investigated PL emission for sensor application with the divalent copper. In the range from 400 to 650 nm, the PL features of samples provide significantly different peak positions with excitation and emission detection. Metal ions contribute to modify the optical characteristics of DX with structural and functional change, which results from the intercalation of them into hydrogen bonding positioned at the center of double helix. The PL intensity is decreased gradually after doping copper ion in the DX tile on the substrate.",
author = "Byeongho Park and Dugasani, {Sreekantha R.} and Youngho Cho and Juyeong Oh and Chulki Kim and Seo, {Min Ah} and Taikjin Lee and Jhon, {Young Miin} and Woo, {Deok Ha} and Seok Lee and Jun, {Seong Chan} and Park, {Sung Ha} and Kim, {Jae Hun}",
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Park, B, Dugasani, SR, Cho, Y, Oh, J, Kim, C, Seo, MA, Lee, T, Jhon, YM, Woo, DH, Lee, S, Jun, SC, Park, SH & Kim, JH 2015, Metal ion sensing solution containing double crossover DNA. in B Lee, Y Rao & SB Lee (eds), Fifth Asia-Pacific Optical Sensors Conference, APOS 2015., 96553A, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9655, SPIE, 5th Asia-Pacific Optical Sensors Conference, APOS 2015, Jeju, Korea, Republic of, 15/5/20. https://doi.org/10.1117/12.2184390

Metal ion sensing solution containing double crossover DNA. / Park, Byeongho; Dugasani, Sreekantha R.; Cho, Youngho; Oh, Juyeong; Kim, Chulki; Seo, Min Ah; Lee, Taikjin; Jhon, Young Miin; Woo, Deok Ha; Lee, Seok; Jun, Seong Chan; Park, Sung Ha; Kim, Jae Hun.

Fifth Asia-Pacific Optical Sensors Conference, APOS 2015. ed. / Byoungho Lee; Yunjiang Rao; Sang Bae Lee. SPIE, 2015. 96553A (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9655).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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AU - Lee, Taikjin

AU - Jhon, Young Miin

AU - Woo, Deok Ha

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AU - Jun, Seong Chan

AU - Park, Sung Ha

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AB - The current study describes metal ion sensing with double crossover DNAs (DX1 and DX2), artificially designed as a platform of doping. The sample for sensing is prepared by a facile annealing method to grow the DXs lattice on a silicon/silicon oxide. Adding and incubating metal ion solution with the sensor substrate into the micro-tube lead the optical property change. Photoluminescence (PL) is employed for detecting the concentration of metal ion in the specimen. We investigated PL emission for sensor application with the divalent copper. In the range from 400 to 650 nm, the PL features of samples provide significantly different peak positions with excitation and emission detection. Metal ions contribute to modify the optical characteristics of DX with structural and functional change, which results from the intercalation of them into hydrogen bonding positioned at the center of double helix. The PL intensity is decreased gradually after doping copper ion in the DX tile on the substrate.

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M3 - Conference contribution

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A2 - Lee, Byoungho

A2 - Rao, Yunjiang

A2 - Lee, Sang Bae

PB - SPIE

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Park B, Dugasani SR, Cho Y, Oh J, Kim C, Seo MA et al. Metal ion sensing solution containing double crossover DNA. In Lee B, Rao Y, Lee SB, editors, Fifth Asia-Pacific Optical Sensors Conference, APOS 2015. SPIE. 2015. 96553A. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2184390