Methodology for improvement of data retention in floating gate flash memory using leakage current estimation

Pyung Moon, Jun Yeong Lim, Tae Un Youn, Keum Whan Noh, Sung Kye Park, Ilgu Yun

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science