The microstructure and ferroelectric properties of Bi3.25La 0.75Ti3O12 films prepared by photochemical metal-organic deposition using photosensitive precursors were characterized. The diffraction intensities showed a distribution similar to Bi 3.25La0.75Ti3O12 ceramics, and Pt(111) was found to not influence the growth orientation of Bi 3.25La0.75Ti3O12 films. The values of measured remnant polarization and dielectric constant of Bi 3.25La0.75Ti3O12 films annealed at 650 and 700° C were 8.7, 16.0 μC/cm2 and 172, 276, respectively. The films remained free of fatigue up to 109 switching cycles. These results suggest the possible application of ferroelectric Bi 3.25La0.75Ti3O12 film, relatively easily and without high cost process such as dry etching.
Bibliographical noteFunding Information:
This research has been supported by the Intelligent Microsystem Center (IMC: http://www.microsystem.re.kr), a 21st Century Frontier R&D Project sponsored by the Korea Ministry of Science and Technology. This work was also supported by the Second Stage of Brain Korea 21 Project in 2007. The experiments at the PLS were supported in part by the MOST and the POSTECH.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics