Microstructures of FeTaN films in the neck region of magnetic recording heads

Jongill Hong, Shan X. Wang

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We found that the columns at the neck region of a magnetic recording inductive head slider composed of FeTaN and NiFe are tilted from the surface normal when the pole materials are sputtered at a low substrate bias power. The electron diffraction patterns show that (110) texture has not strongly developed in the FeTaN film. We have not observed noticeable voids throughout the film on the slider, which suggests the absence of microshape anisotropy. This observation is consistent with our previous study of FeTaN blanket films. We confirmed lattice distortion in the FeTaN due to Ta and N incorporation into a Fe matrix. No significant difference in microstructure between the film on the head slider and the blanket film is found. Based on all the information we have gathered, such as X-ray spectra, pole figures, and high-resolution electron micrographs, we established the crystallographic relationship between (110) orientation, columnar direction, and incident atomic flux in the case of oblique-incident deposition of FeTaN films.

Original languageEnglish
Pages (from-to)3039-3042
Number of pages4
JournalIEEE Transactions on Magnetics
Volume37
Issue number4
DOIs
Publication statusPublished - 2001 Jan 1

Fingerprint

Magnetic recording
Microstructure
Poles
Electron diffraction
Diffraction patterns
Anisotropy
Textures
Fluxes
X rays
Electrons
Substrates

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

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Microstructures of FeTaN films in the neck region of magnetic recording heads. / Hong, Jongill; Wang, Shan X.

In: IEEE Transactions on Magnetics, Vol. 37, No. 4, 01.01.2001, p. 3039-3042.

Research output: Contribution to journalArticle

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