Microwave dielectric properties of magnesium calcium titanate thin films

Byoung Duk Lee, Hong Ryul Lee, Ki Hyun Yoon, Yong Soo Cho

Research output: Contribution to journalArticle

34 Citations (Scopus)

Abstract

The microwave dielectric properties of CaTiO3 (CT), MgTiO 3 (MT) and (Mg0.93Ca0.07)TiO3 (MCT) thin films prepared by the metalorganic solution deposition technique were investigated. The well-crystallized CT, MT and MCT thin films were annealed at 800°C. The microwave dielectric properties of the thin films were measured using a circular-patch capacitor geometry with a network analyzer. The dielectric constant (K), dielectric loss (tan δ) and temperature coefficient of dielectric constant (TCK) of CT films measured up to 6 GHz were 160 ± 3, 0.003 ± 0.0003 and -1340 ppm/°C, respectively. In contrast, the MT films showed K ∼ 16 ± 1, tan δ ∼ 0.0008 ± 0.0001 and TCK ∼ +260 ppm/°C. MCT films exhibited microwave dielectric properties of K ∼ 22 ± 1, tan δ ∼ 0.0012 ± 0002 and TCK ∼ +10 ppm/°C.

Original languageEnglish
Pages (from-to)143-146
Number of pages4
JournalCeramics International
Volume31
Issue number1
DOIs
Publication statusPublished - 2005 Jan 1

Fingerprint

Dielectric properties
Magnesium
Calcium
Microwaves
Thin films
Permittivity
Electric network analyzers
Dielectric losses
Capacitors
Geometry
calcium titanate
perovskite
Temperature

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Lee, Byoung Duk ; Lee, Hong Ryul ; Yoon, Ki Hyun ; Cho, Yong Soo. / Microwave dielectric properties of magnesium calcium titanate thin films. In: Ceramics International. 2005 ; Vol. 31, No. 1. pp. 143-146.
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Microwave dielectric properties of magnesium calcium titanate thin films. / Lee, Byoung Duk; Lee, Hong Ryul; Yoon, Ki Hyun; Cho, Yong Soo.

In: Ceramics International, Vol. 31, No. 1, 01.01.2005, p. 143-146.

Research output: Contribution to journalArticle

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AB - The microwave dielectric properties of CaTiO3 (CT), MgTiO 3 (MT) and (Mg0.93Ca0.07)TiO3 (MCT) thin films prepared by the metalorganic solution deposition technique were investigated. The well-crystallized CT, MT and MCT thin films were annealed at 800°C. The microwave dielectric properties of the thin films were measured using a circular-patch capacitor geometry with a network analyzer. The dielectric constant (K), dielectric loss (tan δ) and temperature coefficient of dielectric constant (TCK) of CT films measured up to 6 GHz were 160 ± 3, 0.003 ± 0.0003 and -1340 ppm/°C, respectively. In contrast, the MT films showed K ∼ 16 ± 1, tan δ ∼ 0.0008 ± 0.0001 and TCK ∼ +260 ppm/°C. MCT films exhibited microwave dielectric properties of K ∼ 22 ± 1, tan δ ∼ 0.0012 ± 0002 and TCK ∼ +10 ppm/°C.

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