Mode analysis and modal delay measurement of few modes fiber by using optical frequency domain reflectometry based on 1550 nm TLS

T. J. Ahn, S. Moon, Y. Youk, Y. Jung, K. Oh, D. Y. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The mode analysis and modal delay measurement based on the optical frequency domain reflectometry is suggested. Modal delay of few modes fiber is measured by OFDR and is compared with traditional pulse delay measurement method.

Original languageEnglish
Title of host publication2005 Quantum Electronics and Laser Science Conference (QELS)
Pages1576-1578
Number of pages3
Publication statusPublished - 2005 Oct 31
Event2005 Quantum Electronics and Laser Science Conference (QELS) - Baltimore, MD, United States
Duration: 2005 May 222005 May 27

Publication series

NameQuantum Electronics and Laser Science Conference (QELS)
Volume3

Other

Other2005 Quantum Electronics and Laser Science Conference (QELS)
CountryUnited States
CityBaltimore, MD
Period05/5/2205/5/27

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Ahn, T. J., Moon, S., Youk, Y., Jung, Y., Oh, K., & Kim, D. Y. (2005). Mode analysis and modal delay measurement of few modes fiber by using optical frequency domain reflectometry based on 1550 nm TLS. In 2005 Quantum Electronics and Laser Science Conference (QELS) (pp. 1576-1578). [JThE5] (Quantum Electronics and Laser Science Conference (QELS); Vol. 3).