Mode analysis and modal delay measurement of few modes fiber by using optical frequency domain reflectometry based on 1550 nm TLS

T. J. Ahn, S. Moon, Y. Youk, Y. Jung, Kyunghwan Oh, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The mode analysis and modal delay measurement based on the optical frequency domain reflectometry is suggested. Modal delay of few modes fiber is measured by OFDR and is compared with traditional pulse delay measurement method.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2006
PublisherOptical Society of America
ISBN (Print)1557528136, 9781557528131
Publication statusPublished - 2006 Jan 1
EventConference on Lasers and Electro-Optics, CLEO 2006 - Long Beach, CA, United States
Duration: 2006 May 212006 May 21

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2006
CountryUnited States
CityLong Beach, CA
Period06/5/2106/5/21

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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    Ahn, T. J., Moon, S., Youk, Y., Jung, Y., Oh, K., & Kim, D. Y. (2006). Mode analysis and modal delay measurement of few modes fiber by using optical frequency domain reflectometry based on 1550 nm TLS. In Conference on Lasers and Electro-Optics, CLEO 2006 (Optics InfoBase Conference Papers). Optical Society of America.