Mode analysis and modal delay measurement of few modes fiber by using optical frequency domain reflectometry based on 1550 nm TLS

T. J. Ahn, S. Moon, Y. Youk, Y. Jung, K. Oh, D. Y. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The mode analysis and modal delay measurement based on the optical frequency domain reflectometry is suggested. Modal delay of few modes fiber is measured by OFDR and is compared with traditional pulse delay measurement method.

Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2005
PublisherOptical Society of America
ISBN (Print)1557527709, 9781557527707
Publication statusPublished - 2005 Jan 1
EventQuantum Electronics and Laser Science Conference, QELS 2005 - Baltimore, MD, United States
Duration: 2005 May 222005 May 22

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2005
CountryUnited States
CityBaltimore, MD
Period05/5/2205/5/22

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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    Ahn, T. J., Moon, S., Youk, Y., Jung, Y., Oh, K., & Kim, D. Y. (2005). Mode analysis and modal delay measurement of few modes fiber by using optical frequency domain reflectometry based on 1550 nm TLS. In Quantum Electronics and Laser Science Conference, QELS 2005 (Optics InfoBase Conference Papers). Optical Society of America.