Model of Inhomogeneous building facade for ray tracing method

S. Kwon; I. S. Koh; H. W. Moon; J. W. Lim; Y. J. Yoon

doi:10.1049/el:20081651

Model of Inhomogeneous building facade for ray tracing method

S. Kwon, I. S. Koh, H. W. Moon, J. W. Lim, Y. J. Yoon

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.

Original language	English
Pages (from-to)	1341-1342
Number of pages	2
Journal	Electronics Letters
Volume	44
Issue number	23
DOIs	https://doi.org/10.1049/el:20081651
Publication status	Published - 2008

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1049/el:20081651

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@article{bebe6c0e41e84faeb30b6f86053c83ba,

title = "Model of Inhomogeneous building facade for ray tracing method",

abstract = "A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.",

author = "S. Kwon and Koh, {I. S.} and Moon, {H. W.} and Lim, {J. W.} and Yoon, {Y. J.}",

year = "2008",

doi = "10.1049/el:20081651",

language = "English",

volume = "44",

pages = "1341--1342",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "Institution of Engineering and Technology",

number = "23",

}

TY - JOUR

T1 - Model of Inhomogeneous building facade for ray tracing method

AU - Kwon, S.

AU - Koh, I. S.

AU - Moon, H. W.

AU - Lim, J. W.

AU - Yoon, Y. J.

PY - 2008

Y1 - 2008

N2 - A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.

AB - A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.

UR - http://www.scopus.com/inward/record.url?scp=55349127851&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=55349127851&partnerID=8YFLogxK

U2 - 10.1049/el:20081651

DO - 10.1049/el:20081651

M3 - Article

AN - SCOPUS:55349127851

VL - 44

SP - 1341

EP - 1342

JO - Electronics Letters

JF - Electronics Letters

SN - 0013-5194

IS - 23

ER -

Model of Inhomogeneous building facade for ray tracing method

Abstract

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