Abstract
A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.
| Original language | English |
|---|---|
| Pages (from-to) | 1341-1342 |
| Number of pages | 2 |
| Journal | Electronics Letters |
| Volume | 44 |
| Issue number | 23 |
| DOIs | |
| Publication status | Published - 2008 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
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Cite this
Kwon, S., Koh, I. S., Moon, H. W., Lim, J. W., & Yoon, Y. J. (2008). Model of Inhomogeneous building facade for ray tracing method. Electronics Letters, 44(23), 1341-1342. https://doi.org/10.1049/el:20081651