Model of Inhomogeneous building facade for ray tracing method

S. Kwon, I. S. Koh, H. W. Moon, J. W. Lim, Y. J. Yoon

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.

Original languageEnglish
Pages (from-to)1341-1342
Number of pages2
JournalElectronics Letters
Volume44
Issue number23
DOIs
Publication statusPublished - 2008

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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