Abstract
A model for considering the scattering effect of an inhomogeneous building facade as an effective reflection coefficient of a homogeneous surface in a ray tracing method is proposed. Hence, the computational complexity of a ray tracing method that considers the effect of inhomogeneous building facades can be preserved as in the conventional method.
Original language | English |
---|---|
Pages (from-to) | 1341-1342 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 44 |
Issue number | 23 |
DOIs | |
Publication status | Published - 2008 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering