Modeling of self-heating effect for depletion-type Si micro-ring modulator

Yoojin Ban, Byung Min Yu, Jinsoo Rhim, Jeong Min Lee, Woo Young Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

We present an accurate model for self-heating effect in depletion-type Si micro-ring modulator which describes incident-power dependent transmission and dynamics. Its accuracy is confirmed with measurement. It can be useful for determining optimal modulation conditions.

Original languageEnglish
Title of host publication2015 IEEE Optical Interconnects Conference, OI 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages134-135
Number of pages2
ISBN (Electronic)9781479981793
DOIs
Publication statusPublished - 2015 Jan 1
Event2015 IEEE Optical Interconnects Conference, OI 2015 - San Diego, United States
Duration: 2015 Apr 202015 Apr 22

Other

Other2015 IEEE Optical Interconnects Conference, OI 2015
CountryUnited States
CitySan Diego
Period15/4/2015/4/22

Fingerprint

Modulators
modulators
depletion
Modulation
modulation
Heating
heating
rings

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Networks and Communications
  • Hardware and Architecture
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Cite this

Ban, Y., Yu, B. M., Rhim, J., Lee, J. M., & Choi, W. Y. (2015). Modeling of self-heating effect for depletion-type Si micro-ring modulator. In 2015 IEEE Optical Interconnects Conference, OI 2015 (pp. 134-135). [7115722] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OIC.2015.7115722
Ban, Yoojin ; Yu, Byung Min ; Rhim, Jinsoo ; Lee, Jeong Min ; Choi, Woo Young. / Modeling of self-heating effect for depletion-type Si micro-ring modulator. 2015 IEEE Optical Interconnects Conference, OI 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 134-135
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Ban, Y, Yu, BM, Rhim, J, Lee, JM & Choi, WY 2015, Modeling of self-heating effect for depletion-type Si micro-ring modulator. in 2015 IEEE Optical Interconnects Conference, OI 2015., 7115722, Institute of Electrical and Electronics Engineers Inc., pp. 134-135, 2015 IEEE Optical Interconnects Conference, OI 2015, San Diego, United States, 15/4/20. https://doi.org/10.1109/OIC.2015.7115722

Modeling of self-heating effect for depletion-type Si micro-ring modulator. / Ban, Yoojin; Yu, Byung Min; Rhim, Jinsoo; Lee, Jeong Min; Choi, Woo Young.

2015 IEEE Optical Interconnects Conference, OI 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 134-135 7115722.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Ban Y, Yu BM, Rhim J, Lee JM, Choi WY. Modeling of self-heating effect for depletion-type Si micro-ring modulator. In 2015 IEEE Optical Interconnects Conference, OI 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 134-135. 7115722 https://doi.org/10.1109/OIC.2015.7115722