Modification of interface magnetic anisotropy by ion irradiation on epitaxial Cu/Ni/Cu(002)/Si(100) films

J. S. Lee, K. B. Lee, Y. J. Park, T. G. Kim, J. H. Song, K. H. Chae, J. Lee, C. N. Whang, K. Jeong, D. H. Kim, S. C. Shin

Research output: Contribution to journalArticle

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Abstract

Various x-ray scattering and magnetic measurements were employed to reveal changes in intrinsic structural and magnetic properties on epitaxial Cu/Ni(t)/Cu(002)/Si(100) thin films (t = 20, 30, 60, and 90 Å) before and after 1 MeV C+ ion irradiation. Torque magnetometer and grazing incidence x-ray diffraction measurements were carried out to understand relation between magnetic and structural properties, respectively. X-ray reflectivity measurements were performed to characterize interface roughness and intermixing. It is observed that effective magnetic anisotropy values of ion-irradiated films are negative over the entire nickel thickness range and the dominant factor of the reorientation of magnetic easy axis from surface normal to surface parallel is reduction of the interface magnetic anisotropy coefficient in spite of decreased interface mixing after ion irradiation.

Original languageEnglish
Article number172405
Pages (from-to)172405-1-172405-4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume69
Issue number17
DOIs
Publication statusPublished - 2004 May 1

Fingerprint

Magnetic anisotropy
Ion bombardment
ion irradiation
X rays
anisotropy
Structural properties
Magnetic properties
magnetic properties
Magnetic variables measurement
Magnetometers
x ray scattering
Nickel
grazing incidence
magnetometers
retraining
magnetic measurement
torque
x ray diffraction
roughness
Torque

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Lee, J. S., Lee, K. B., Park, Y. J., Kim, T. G., Song, J. H., Chae, K. H., ... Shin, S. C. (2004). Modification of interface magnetic anisotropy by ion irradiation on epitaxial Cu/Ni/Cu(002)/Si(100) films. Physical Review B - Condensed Matter and Materials Physics, 69(17), 172405-1-172405-4. [172405]. https://doi.org/10.1103/PhysRevB.69.172405
Lee, J. S. ; Lee, K. B. ; Park, Y. J. ; Kim, T. G. ; Song, J. H. ; Chae, K. H. ; Lee, J. ; Whang, C. N. ; Jeong, K. ; Kim, D. H. ; Shin, S. C. / Modification of interface magnetic anisotropy by ion irradiation on epitaxial Cu/Ni/Cu(002)/Si(100) films. In: Physical Review B - Condensed Matter and Materials Physics. 2004 ; Vol. 69, No. 17. pp. 172405-1-172405-4.
@article{d7295f02b8e74f4eb424c87b35af361a,
title = "Modification of interface magnetic anisotropy by ion irradiation on epitaxial Cu/Ni/Cu(002)/Si(100) films",
abstract = "Various x-ray scattering and magnetic measurements were employed to reveal changes in intrinsic structural and magnetic properties on epitaxial Cu/Ni(t)/Cu(002)/Si(100) thin films (t = 20, 30, 60, and 90 {\AA}) before and after 1 MeV C+ ion irradiation. Torque magnetometer and grazing incidence x-ray diffraction measurements were carried out to understand relation between magnetic and structural properties, respectively. X-ray reflectivity measurements were performed to characterize interface roughness and intermixing. It is observed that effective magnetic anisotropy values of ion-irradiated films are negative over the entire nickel thickness range and the dominant factor of the reorientation of magnetic easy axis from surface normal to surface parallel is reduction of the interface magnetic anisotropy coefficient in spite of decreased interface mixing after ion irradiation.",
author = "Lee, {J. S.} and Lee, {K. B.} and Park, {Y. J.} and Kim, {T. G.} and Song, {J. H.} and Chae, {K. H.} and J. Lee and Whang, {C. N.} and K. Jeong and Kim, {D. H.} and Shin, {S. C.}",
year = "2004",
month = "5",
day = "1",
doi = "10.1103/PhysRevB.69.172405",
language = "English",
volume = "69",
pages = "172405--1--172405--4",
journal = "Physical Review B-Condensed Matter",
issn = "1098-0121",
publisher = "American Physical Society",
number = "17",

}

Lee, JS, Lee, KB, Park, YJ, Kim, TG, Song, JH, Chae, KH, Lee, J, Whang, CN, Jeong, K, Kim, DH & Shin, SC 2004, 'Modification of interface magnetic anisotropy by ion irradiation on epitaxial Cu/Ni/Cu(002)/Si(100) films', Physical Review B - Condensed Matter and Materials Physics, vol. 69, no. 17, 172405, pp. 172405-1-172405-4. https://doi.org/10.1103/PhysRevB.69.172405

Modification of interface magnetic anisotropy by ion irradiation on epitaxial Cu/Ni/Cu(002)/Si(100) films. / Lee, J. S.; Lee, K. B.; Park, Y. J.; Kim, T. G.; Song, J. H.; Chae, K. H.; Lee, J.; Whang, C. N.; Jeong, K.; Kim, D. H.; Shin, S. C.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 69, No. 17, 172405, 01.05.2004, p. 172405-1-172405-4.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Modification of interface magnetic anisotropy by ion irradiation on epitaxial Cu/Ni/Cu(002)/Si(100) films

AU - Lee, J. S.

AU - Lee, K. B.

AU - Park, Y. J.

AU - Kim, T. G.

AU - Song, J. H.

AU - Chae, K. H.

AU - Lee, J.

AU - Whang, C. N.

AU - Jeong, K.

AU - Kim, D. H.

AU - Shin, S. C.

PY - 2004/5/1

Y1 - 2004/5/1

N2 - Various x-ray scattering and magnetic measurements were employed to reveal changes in intrinsic structural and magnetic properties on epitaxial Cu/Ni(t)/Cu(002)/Si(100) thin films (t = 20, 30, 60, and 90 Å) before and after 1 MeV C+ ion irradiation. Torque magnetometer and grazing incidence x-ray diffraction measurements were carried out to understand relation between magnetic and structural properties, respectively. X-ray reflectivity measurements were performed to characterize interface roughness and intermixing. It is observed that effective magnetic anisotropy values of ion-irradiated films are negative over the entire nickel thickness range and the dominant factor of the reorientation of magnetic easy axis from surface normal to surface parallel is reduction of the interface magnetic anisotropy coefficient in spite of decreased interface mixing after ion irradiation.

AB - Various x-ray scattering and magnetic measurements were employed to reveal changes in intrinsic structural and magnetic properties on epitaxial Cu/Ni(t)/Cu(002)/Si(100) thin films (t = 20, 30, 60, and 90 Å) before and after 1 MeV C+ ion irradiation. Torque magnetometer and grazing incidence x-ray diffraction measurements were carried out to understand relation between magnetic and structural properties, respectively. X-ray reflectivity measurements were performed to characterize interface roughness and intermixing. It is observed that effective magnetic anisotropy values of ion-irradiated films are negative over the entire nickel thickness range and the dominant factor of the reorientation of magnetic easy axis from surface normal to surface parallel is reduction of the interface magnetic anisotropy coefficient in spite of decreased interface mixing after ion irradiation.

UR - http://www.scopus.com/inward/record.url?scp=42749109024&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=42749109024&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.69.172405

DO - 10.1103/PhysRevB.69.172405

M3 - Article

AN - SCOPUS:42749109024

VL - 69

SP - 172405-1-172405-4

JO - Physical Review B-Condensed Matter

JF - Physical Review B-Condensed Matter

SN - 1098-0121

IS - 17

M1 - 172405

ER -