Various x-ray scattering and magnetic measurements were employed to reveal changes in intrinsic structural and magnetic properties on epitaxial Cu/Ni(t)/Cu(002)/Si(100) thin films (t = 20, 30, 60, and 90 Å) before and after 1 MeV C+ ion irradiation. Torque magnetometer and grazing incidence x-ray diffraction measurements were carried out to understand relation between magnetic and structural properties, respectively. X-ray reflectivity measurements were performed to characterize interface roughness and intermixing. It is observed that effective magnetic anisotropy values of ion-irradiated films are negative over the entire nickel thickness range and the dominant factor of the reorientation of magnetic easy axis from surface normal to surface parallel is reduction of the interface magnetic anisotropy coefficient in spite of decreased interface mixing after ion irradiation.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - 2004 May 1|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics