Monitoring excited state charge transfer of transition metal mixed-valence complexes with femtosecond x-ray absorption and emission spectroscopy

Zachary W. Fox, Amy Cordones-Hahn, Kasper S. Kjær, James D. Gaynor, Kiryong Hong, Jae Hyuk Lee, Julia Carlstad, Marco Reinhard, Seunghee Lee, Roberto Alonso-Mori, Matthieu Chollet, Thomas Kroll, James M. Glownia, Tae Kyu Kim, Amity Andersen, Yu Zhang, Shaul Mukamel, Niranjan Govind, Robert W. Schoenlein, Munira Khalil

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Femtosecond X-ray absorption and emission spectroscopies are used at the Fe K-edge to directly monitor transient oxidation states and orbital occupancy during charge transfer in a series of solvated mixed-valence complexes.

Original languageEnglish
Title of host publicationInternational Conference on Ultrafast Phenomena, UP 2016
PublisherOSA - The Optical Society
ISBN (Print)9781943580187
DOIs
Publication statusPublished - 2016 Jul 18
EventInternational Conference on Ultrafast Phenomena, UP 2016 - Santa Fe, United States
Duration: 2016 Jul 172016 Jul 22

Publication series

NameOptics InfoBase Conference Papers

Conference

ConferenceInternational Conference on Ultrafast Phenomena, UP 2016
CountryUnited States
CitySanta Fe
Period16/7/1716/7/22

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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  • Cite this

    Fox, Z. W., Cordones-Hahn, A., Kjær, K. S., Gaynor, J. D., Hong, K., Lee, J. H., Carlstad, J., Reinhard, M., Lee, S., Alonso-Mori, R., Chollet, M., Kroll, T., Glownia, J. M., Kim, T. K., Andersen, A., Zhang, Y., Mukamel, S., Govind, N., Schoenlein, R. W., & Khalil, M. (2016). Monitoring excited state charge transfer of transition metal mixed-valence complexes with femtosecond x-ray absorption and emission spectroscopy. In International Conference on Ultrafast Phenomena, UP 2016 (Optics InfoBase Conference Papers). OSA - The Optical Society. https://doi.org/10.1364/UP.2016.UTh4A.2