Morphological investigation of aluminium nitride films on various substrates for MEMS applications

J. P. Kar, G. Bose, S. Tuli, J. M. Myoung, S. Mukherjee

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Piezoelectric films, such as aluminium nitride (AlN), are of great interest for the fabrication of thin film bulk/surface acoustic resonators, where the growth parameters and the substrate material influence the morphological properties. Herein, AlN films were deposited using RF reactive sputtering on Si, SiO2, metal (Al, Cu, Cr and Au) coated silicon, GaAs and InP substrates. C-axis (002) oriented AlN films were observed on most of the substrates, where the surface morphologies of the films grown on the 1.5 mm thick SiO2 layer and GaAs substrate were found to be non-uniform. Moreover, AlN films deposited on the Cr electrode exhibit well textured film with fairly uniform grains, while the films deposited on other metal electrodes exhibit a granular type of structure with mixed small and large grains. After optimisation of growth parameters, silicon micromachining was performed by the wet chemical etching method. Suspended Cr-AlN-Cr-SiO2 cantilevers of 20 μm in width were fabricated for futuristic microelectromechanical systems (MEMS) applications.

Original languageEnglish
Pages (from-to)526-530
Number of pages5
JournalSurface Engineering
Volume25
Issue number7
DOIs
Publication statusPublished - 2009 Oct 1

Fingerprint

Aluminum nitride
aluminum nitrides
microelectromechanical systems
MEMS
Substrates
Silicon
Metals
Acoustic resonators
Electrodes
electrodes
Wet etching
Reactive sputtering
Micromachining
silicon
micromachining
aluminum nitride
Substrate
Aluminum
metals
Surface morphology

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Kar, J. P. ; Bose, G. ; Tuli, S. ; Myoung, J. M. ; Mukherjee, S. / Morphological investigation of aluminium nitride films on various substrates for MEMS applications. In: Surface Engineering. 2009 ; Vol. 25, No. 7. pp. 526-530.
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Morphological investigation of aluminium nitride films on various substrates for MEMS applications. / Kar, J. P.; Bose, G.; Tuli, S.; Myoung, J. M.; Mukherjee, S.

In: Surface Engineering, Vol. 25, No. 7, 01.10.2009, p. 526-530.

Research output: Contribution to journalArticle

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