Abstract
Scanning probe instruments have expanded beyond their traditional role as imaging or "reading" tools and are now routinely used for "writing." Although a variety of scanning probe lithography techniques are available, each one imposes different requirements on the types of probes that must be used. Additionally, throughput is a major concern for serial writing techniques, so for a scanning probe lithography technique to become widely applied, there needs to be a reasonable path toward a scalable architecture. Here, we use a multilayer graphene coating method to create multifunctional massively parallel probe arrays that have wear-resistant tips of uncompromised sharpness and high electrical and thermal conductivities. The optical transparency and mechanical flexibility of graphene allow this procedure to be used for coating exceptionally large, cantilever-free arrays that can pattern with electrochemical desorption and thermal, in addition to conventional, dip-pen nanolithography.
| Original language | English |
|---|---|
| Pages (from-to) | 18312-18317 |
| Number of pages | 6 |
| Journal | Proceedings of the National Academy of Sciences of the United States of America |
| Volume | 109 |
| Issue number | 45 |
| DOIs | |
| Publication status | Published - 2012 Nov 6 |
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All Science Journal Classification (ASJC) codes
- General
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Multifunctional cantilever-free scanning probe arrays coated with multilayer graphene. / Shim, Wooyoung; Brown, Keith A.; Zhou, Xiaozhu; Rasin, Boris; Liao, Xing; Mirkin, Chad A.
In: Proceedings of the National Academy of Sciences of the United States of America, Vol. 109, No. 45, 06.11.2012, p. 18312-18317.Research output: Contribution to journal › Article
TY - JOUR
T1 - Multifunctional cantilever-free scanning probe arrays coated with multilayer graphene
AU - Shim, Wooyoung
AU - Brown, Keith A.
AU - Zhou, Xiaozhu
AU - Rasin, Boris
AU - Liao, Xing
AU - Mirkin, Chad A.
PY - 2012/11/6
Y1 - 2012/11/6
N2 - Scanning probe instruments have expanded beyond their traditional role as imaging or "reading" tools and are now routinely used for "writing." Although a variety of scanning probe lithography techniques are available, each one imposes different requirements on the types of probes that must be used. Additionally, throughput is a major concern for serial writing techniques, so for a scanning probe lithography technique to become widely applied, there needs to be a reasonable path toward a scalable architecture. Here, we use a multilayer graphene coating method to create multifunctional massively parallel probe arrays that have wear-resistant tips of uncompromised sharpness and high electrical and thermal conductivities. The optical transparency and mechanical flexibility of graphene allow this procedure to be used for coating exceptionally large, cantilever-free arrays that can pattern with electrochemical desorption and thermal, in addition to conventional, dip-pen nanolithography.
AB - Scanning probe instruments have expanded beyond their traditional role as imaging or "reading" tools and are now routinely used for "writing." Although a variety of scanning probe lithography techniques are available, each one imposes different requirements on the types of probes that must be used. Additionally, throughput is a major concern for serial writing techniques, so for a scanning probe lithography technique to become widely applied, there needs to be a reasonable path toward a scalable architecture. Here, we use a multilayer graphene coating method to create multifunctional massively parallel probe arrays that have wear-resistant tips of uncompromised sharpness and high electrical and thermal conductivities. The optical transparency and mechanical flexibility of graphene allow this procedure to be used for coating exceptionally large, cantilever-free arrays that can pattern with electrochemical desorption and thermal, in addition to conventional, dip-pen nanolithography.
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U2 - 10.1073/pnas.1216183109
DO - 10.1073/pnas.1216183109
M3 - Article
VL - 109
SP - 18312
EP - 18317
JO - Proceedings of the National Academy of Sciences of the United States of America
JF - Proceedings of the National Academy of Sciences of the United States of America
SN - 0027-8424
IS - 45
ER -