Engineering
Charge Injection
33%
Current Drain
33%
Current Ratio
33%
Cycles
33%
Data Retention
33%
Demonstrates
33%
Field-Effect Transistor
33%
Gate Voltage
100%
Hysteresis
66%
Hysteresis Curve
33%
Long Time
33%
Memory Performance
33%
Mixed Water
33%
Nonvolatile Memory
66%
Passivation
33%
Passivation Layer
66%
Polymer
66%
Resistive
33%
Sensing Performance
33%
Single-Walled Carbon Nanotube
100%
Small Amount
33%
Source Characteristic
33%
Switching
33%
Switching Time
33%
Temperature
33%
Transistor
66%
Water
66%
Zeros
33%
Computer Science
Application Memory
33%
Channels
66%
Current-State
66%
Data Retention
33%
Hysteresis Curve
33%
Information Storage
33%
Memory Operation
33%
Memory Performance
33%
Non-Volatile Memory
66%
Nonvolatile
33%
Nonvolatile Data
33%
Switching
33%
Material Science
Air
33%
Charge Trapping
33%
Devices
66%
Durability
33%
Polymer
66%
Solution
66%