The binary defocusing technique has enabled speed breakthroughs for 3D shape measurement, yet simultaneously achieving high accuracy and high speed remains difficult. To overcome this limitation, we propose to utilize multilevel symmetric pattern for high-speed and high-accuracy 3D shape measurement. Compared to conventional binary patterns, multilevel pattern could bring more flexibility for eliminating undesired high-frequency harmonics, thus has the potential to greatly enhance the phase quality and measurement accuracy. In this paper, the symmetric pattern design principle and related optimization procedure are presented in order to find the “best” multilevel fringe patterns. Both simulation and experiments verify that with respect to conventional methods, the proposed method could consistently generate better fringe patterns for a wide range of fringe periods. Furthermore, we developed an absolute 3D shape measurement system with the speed of 667 Hz, verifying that the proposed method is applicable for high-speed, high-accuracy applications.
Bibliographical noteFunding Information:
This study was sponsored by the National Natural Science Foundation of China (NSFC) (Grant No. 61603360 ), the National Science Foundation (Grant No. IIS-1637961 ), and the Open Fund of the Key Laboratory of Metallurgical Equipment and Control of Ministry of Education in Wuhan University of Science and Technology (Grant No. 2018B06 ).
© 2020 Elsevier Ltd
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering