Multiple labeling fluorescence lifetime analysis in a single shot imaging

Young Sik Song, Young Jae Won, Chang Jun Lee, Dug Young Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We propose new approaches analysis for fluorescence lifetime imaging measurement of multiple labeling at single shot process. This paper suggests analysis concept of which can extract small scale signal ratio simply in the complex environment.

Original languageEnglish
Title of host publication2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467371094
DOIs
Publication statusPublished - 2016 Jan 7
Event11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 - Busan, Korea, Republic of
Duration: 2015 Aug 242015 Aug 28

Publication series

Name2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
Volume3

Other

Other11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
CountryKorea, Republic of
CityBusan
Period15/8/2415/8/28

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Song, Y. S., Won, Y. J., Lee, C. J., & Kim, D. Y. (2016). Multiple labeling fluorescence lifetime analysis in a single shot imaging. In 2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 [7376544] (2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015; Vol. 3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2015.7376544