Multiple resolution chirp reflectometry for fault localization and diagnosis in a high voltage cable in automotive electronics

Seung Jin Chang, Chun Ku Lee, Yong June Shin, Jin Bae Park

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A multiple chirp reflectometry system with a fault estimation process is proposed to obtain multiple resolution and to measure the degree of fault in a target cable. A multiple resolution algorithm has the ability to localize faults, regardless of fault location. The time delay information, which is derived from the normalized cross-correlation between the incident signal and bandpass filtered reflected signals, is converted to a fault location and cable length. The in-phase and quadrature components are obtained by lowpass filtering of the mixed signal of the incident signal and the reflected signal. Based on in-phase and quadrature components, the reflection coefficient is estimated by the proposed fault estimation process including the mixing and filtering procedure. Also, the measurement uncertainty for this experiment is analyzed according to the Guide to the Expression of Uncertainty in Measurement. To verify the performance of the proposed method, we conduct comparative experiments to detect and measure faults under different conditions. Considering the installation environment of the high voltage cable used in an actual vehicle, target cable length and fault position are designed. To simulate the degree of fault, the variety of termination impedance (10 Ω, 30 Ω, 50 Ω, and 1 k Ω) are used and estimated by the proposed method in this experiment. The proposed method demonstrates advantages in that it has multiple resolution to overcome the blind spot problem, and can assess the state of the fault.

Original languageEnglish
Article number125006
JournalMeasurement Science and Technology
Volume27
Issue number12
DOIs
Publication statusPublished - 2016 Oct 19

Fingerprint

Automobile electronic equipment
Reflectometry
Chirp
chirp
Cable
cables
high voltages
Cables
Fault
Voltage
Electronics
Electric fault location
Electric potential
electronics
quadratures
Experiments
Time delay
Quadrature
cross correlation
installing

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Applied Mathematics

Cite this

@article{088b8bd9c01a4aabb23d78b21e3de679,
title = "Multiple resolution chirp reflectometry for fault localization and diagnosis in a high voltage cable in automotive electronics",
abstract = "A multiple chirp reflectometry system with a fault estimation process is proposed to obtain multiple resolution and to measure the degree of fault in a target cable. A multiple resolution algorithm has the ability to localize faults, regardless of fault location. The time delay information, which is derived from the normalized cross-correlation between the incident signal and bandpass filtered reflected signals, is converted to a fault location and cable length. The in-phase and quadrature components are obtained by lowpass filtering of the mixed signal of the incident signal and the reflected signal. Based on in-phase and quadrature components, the reflection coefficient is estimated by the proposed fault estimation process including the mixing and filtering procedure. Also, the measurement uncertainty for this experiment is analyzed according to the Guide to the Expression of Uncertainty in Measurement. To verify the performance of the proposed method, we conduct comparative experiments to detect and measure faults under different conditions. Considering the installation environment of the high voltage cable used in an actual vehicle, target cable length and fault position are designed. To simulate the degree of fault, the variety of termination impedance (10 Ω, 30 Ω, 50 Ω, and 1 k Ω) are used and estimated by the proposed method in this experiment. The proposed method demonstrates advantages in that it has multiple resolution to overcome the blind spot problem, and can assess the state of the fault.",
author = "{Jin Chang}, Seung and {Ku Lee}, Chun and Shin, {Yong June} and Park, {Jin Bae}",
year = "2016",
month = "10",
day = "19",
doi = "10.1088/0957-0233/27/12/125006",
language = "English",
volume = "27",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "12",

}

Multiple resolution chirp reflectometry for fault localization and diagnosis in a high voltage cable in automotive electronics. / Jin Chang, Seung; Ku Lee, Chun; Shin, Yong June; Park, Jin Bae.

In: Measurement Science and Technology, Vol. 27, No. 12, 125006, 19.10.2016.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Multiple resolution chirp reflectometry for fault localization and diagnosis in a high voltage cable in automotive electronics

AU - Jin Chang, Seung

AU - Ku Lee, Chun

AU - Shin, Yong June

AU - Park, Jin Bae

PY - 2016/10/19

Y1 - 2016/10/19

N2 - A multiple chirp reflectometry system with a fault estimation process is proposed to obtain multiple resolution and to measure the degree of fault in a target cable. A multiple resolution algorithm has the ability to localize faults, regardless of fault location. The time delay information, which is derived from the normalized cross-correlation between the incident signal and bandpass filtered reflected signals, is converted to a fault location and cable length. The in-phase and quadrature components are obtained by lowpass filtering of the mixed signal of the incident signal and the reflected signal. Based on in-phase and quadrature components, the reflection coefficient is estimated by the proposed fault estimation process including the mixing and filtering procedure. Also, the measurement uncertainty for this experiment is analyzed according to the Guide to the Expression of Uncertainty in Measurement. To verify the performance of the proposed method, we conduct comparative experiments to detect and measure faults under different conditions. Considering the installation environment of the high voltage cable used in an actual vehicle, target cable length and fault position are designed. To simulate the degree of fault, the variety of termination impedance (10 Ω, 30 Ω, 50 Ω, and 1 k Ω) are used and estimated by the proposed method in this experiment. The proposed method demonstrates advantages in that it has multiple resolution to overcome the blind spot problem, and can assess the state of the fault.

AB - A multiple chirp reflectometry system with a fault estimation process is proposed to obtain multiple resolution and to measure the degree of fault in a target cable. A multiple resolution algorithm has the ability to localize faults, regardless of fault location. The time delay information, which is derived from the normalized cross-correlation between the incident signal and bandpass filtered reflected signals, is converted to a fault location and cable length. The in-phase and quadrature components are obtained by lowpass filtering of the mixed signal of the incident signal and the reflected signal. Based on in-phase and quadrature components, the reflection coefficient is estimated by the proposed fault estimation process including the mixing and filtering procedure. Also, the measurement uncertainty for this experiment is analyzed according to the Guide to the Expression of Uncertainty in Measurement. To verify the performance of the proposed method, we conduct comparative experiments to detect and measure faults under different conditions. Considering the installation environment of the high voltage cable used in an actual vehicle, target cable length and fault position are designed. To simulate the degree of fault, the variety of termination impedance (10 Ω, 30 Ω, 50 Ω, and 1 k Ω) are used and estimated by the proposed method in this experiment. The proposed method demonstrates advantages in that it has multiple resolution to overcome the blind spot problem, and can assess the state of the fault.

UR - http://www.scopus.com/inward/record.url?scp=84995538136&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84995538136&partnerID=8YFLogxK

U2 - 10.1088/0957-0233/27/12/125006

DO - 10.1088/0957-0233/27/12/125006

M3 - Article

VL - 27

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 12

M1 - 125006

ER -