MVP ECC: Manufacturing process variation aware unequal protection ECC for memory reliability

Seungyeob Lee, Joon Sung Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

With a development of process technology, a memory density has been increased. However, a smaller feature size makes the memory susceptible to soft errors. For reliability enhancement, ECC with single bit error correction and double bit error detection is widely used. As multiple bit cell upset become dominant, there is a need for stronger ECC. ECC such as RS or BCH code requires significantly large overhead and longer latency. To overcome the problem, this paper introduces an unequal protection ECC assigning stronger level of protection to weak memory cells and normal level to normal cells. Information from manufacturing characterization test is utilized to identify weak memory cells with low design margins. Instead of equally treating all memory cells, the proposed ECC focuses more on the weak cells since they are more susceptible to soft errors. Compared to conventional ECCs, experimental results show that the proposed ECC considerably enhances memory reliability with the same code length.

Original languageEnglish
Title of host publicationProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages846-851
Number of pages6
ISBN (Electronic)9783981537093
DOIs
Publication statusPublished - 2017 May 11
Event20th Design, Automation and Test in Europe, DATE 2017 - Swisstech, Lausanne, Switzerland
Duration: 2017 Mar 272017 Mar 31

Publication series

NameProceedings of the 2017 Design, Automation and Test in Europe, DATE 2017

Other

Other20th Design, Automation and Test in Europe, DATE 2017
CountrySwitzerland
CitySwisstech, Lausanne
Period17/3/2717/3/31

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Lee, S., & Yang, J. S. (2017). MVP ECC: Manufacturing process variation aware unequal protection ECC for memory reliability. In Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017 (pp. 846-851). [7927105] (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/DATE.2017.7927105