Nano grating-based plasmon enhancement in total internal reflection fluorescence microscopy

Kyujung Kim, Dong Jun Kim, Eun Jin Cho, Yong Min Huh, Jin Suck Seo, Donghyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents based on nano-grating based field enhancement in total internal reflection fluorescence microscopy. A sample of silver grating/film on a glass substrate was used for imaging microbeads and confirmed the field enhancement by twice.

Original languageEnglish
Title of host publicationOptical Fabrication and Testing, OFT 2008
PublisherOptical Society of America
ISBN (Print)9781557528612
Publication statusPublished - 2008 Jan 1
EventOptical Fabrication and Testing, OFT 2008 - Rochester, NY, United States
Duration: 2008 Oct 212008 Oct 24

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherOptical Fabrication and Testing, OFT 2008
CountryUnited States
CityRochester, NY
Period08/10/2108/10/24

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Kim, K., Kim, D. J., Cho, E. J., Huh, Y. M., Seo, J. S., & Kim, D. (2008). Nano grating-based plasmon enhancement in total internal reflection fluorescence microscopy. In Optical Fabrication and Testing, OFT 2008 (Optics InfoBase Conference Papers). Optical Society of America.