Near-field phase correction for superresolution enhancement

Kwangchil Lee, Youngjean Jung, Kyoungsik Kim

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

Although superresolution can be successfully obtained by negative index materials, the unavoidable losses ultimately limits image resolution. Using the near-field active phase-correction method, we theoretically predict the significant enhancement of both superresolution and transmission in a realistic lossy superlens system. In a SiC superlens system, resolvable separation between two slits significantly improves from λ/4.2 to λ/14.2 and the transmission increases 30.5 times compared to the conventional index match method.

Original languageEnglish
Article number033109
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume80
Issue number3
DOIs
Publication statusPublished - 2009 Aug 6

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near fields
augmentation
image resolution
Image resolution
slits

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

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Near-field phase correction for superresolution enhancement. / Lee, Kwangchil; Jung, Youngjean; Kim, Kyoungsik.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 80, No. 3, 033109, 06.08.2009.

Research output: Contribution to journalArticle

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