Near-field to far-field transformation based on stratton-chu fomula for EMC measurements

Jeong Seok Lee, Tae Lim Song, Jin Kyoung Du, Jong Gwan Yook

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

This paper deals with the near-field to far-field transformation for electromagnetic compatibility (EMC) testing. Since the conventional EMC testing has an inefficient measurement process, Stratton-Chu formula is used to predict the far-field emission by a simple and direct process. The near-filed of a microstrip patch antenna is extracted at regular interval from the focused plane, and the far-field is generated from the near-field by Stratton-Chu formula. Through the three-dimensional electromagnetic (EM) field simulation, calculated far-field results of the patch antenna from Stratton-Chu formula computation are proven to be available. In comparison with full-wave analysis, outcomes of computed far-field have error less than 3.1%.

Original languageEnglish
Title of host publication2013 IEEE Antennas and Propagation Society International Symposium, APSURSI 2013 - Proceedings
Pages606-607
Number of pages2
DOIs
Publication statusPublished - 2013 Dec 1
Event2013 IEEE Antennas and Propagation Society International Symposium, APSURSI 2013 - Orlando, FL, United States
Duration: 2013 Jul 72013 Jul 13

Publication series

NameIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
ISSN (Print)1522-3965

Other

Other2013 IEEE Antennas and Propagation Society International Symposium, APSURSI 2013
CountryUnited States
CityOrlando, FL
Period13/7/713/7/13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Lee, J. S., Song, T. L., Du, J. K., & Yook, J. G. (2013). Near-field to far-field transformation based on stratton-chu fomula for EMC measurements. In 2013 IEEE Antennas and Propagation Society International Symposium, APSURSI 2013 - Proceedings (pp. 606-607). [6710963] (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)). https://doi.org/10.1109/APS.2013.6710963