Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition

Young Don Ko, Hong Seong Kang, Min Chang Jeong, Sang Yeol Lee, Jae Min Myoung, Ilgu Yun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this study the D-optimal design was used to make design matrix in this experiment. Neural networks (NNets) based on the backpropagation (BP) algorithm are applied to the pulsed laser deposition (PLD) process modeling in order to construct the model for the growth rate of the ZnO thin films.

Original languageEnglish
Title of host publicationIMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages79-80
Number of pages2
ISBN (Electronic)0780384237, 9780780384231
DOIs
Publication statusPublished - 2004 Jan 1
Event2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 - Kyoto, Japan
Duration: 2004 Jul 262004 Jul 28

Other

Other2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004
CountryJapan
CityKyoto
Period04/7/2604/7/28

Fingerprint

Backpropagation algorithms
Pulsed laser deposition
Neural networks
Thin films
Experiments
Optimal design

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Ko, Y. D., Kang, H. S., Jeong, M. C., Lee, S. Y., Myoung, J. M., & Yun, I. (2004). Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. In IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai (pp. 79-80). [1566417] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMFEDK.2004.1566417
Ko, Young Don ; Kang, Hong Seong ; Jeong, Min Chang ; Lee, Sang Yeol ; Myoung, Jae Min ; Yun, Ilgu. / Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc., 2004. pp. 79-80
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abstract = "In this study the D-optimal design was used to make design matrix in this experiment. Neural networks (NNets) based on the backpropagation (BP) algorithm are applied to the pulsed laser deposition (PLD) process modeling in order to construct the model for the growth rate of the ZnO thin films.",
author = "Ko, {Young Don} and Kang, {Hong Seong} and Jeong, {Min Chang} and Lee, {Sang Yeol} and Myoung, {Jae Min} and Ilgu Yun",
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Ko, YD, Kang, HS, Jeong, MC, Lee, SY, Myoung, JM & Yun, I 2004, Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. in IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai., 1566417, Institute of Electrical and Electronics Engineers Inc., pp. 79-80, 2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004, Kyoto, Japan, 04/7/26. https://doi.org/10.1109/IMFEDK.2004.1566417

Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. / Ko, Young Don; Kang, Hong Seong; Jeong, Min Chang; Lee, Sang Yeol; Myoung, Jae Min; Yun, Ilgu.

IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc., 2004. p. 79-80 1566417.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Ko YD, Kang HS, Jeong MC, Lee SY, Myoung JM, Yun I. Neural network based modeling for the growth rate of ZnO thin films on the pulsed laser deposition. In IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc. 2004. p. 79-80. 1566417 https://doi.org/10.1109/IMFEDK.2004.1566417