In this study the D-optimal design was used to make design matrix in this experiment. Neural networks (NNets) based on the backpropagation (BP) algorithm are applied to the pulsed laser deposition (PLD) process modeling in order to construct the model for the growth rate of the ZnO thin films.
|Title of host publication||IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||2|
|ISBN (Electronic)||0780384237, 9780780384231|
|Publication status||Published - 2004|
|Event||2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 - Kyoto, Japan|
Duration: 2004 Jul 26 → 2004 Jul 28
|Name||IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai|
|Other||2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004|
|Period||04/7/26 → 04/7/28|
Bibliographical notePublisher Copyright:
© 2015 IEEE.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering