In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.
|Title of host publication||AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||4|
|ISBN (Print)||0780357051, 9780780357051|
|Publication status||Published - 1999|
|Event||1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999 - Seoul, Korea, Republic of|
Duration: 1999 Aug 23 → 1999 Aug 25
|Name||AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs|
|Other||1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999|
|Country||Korea, Republic of|
|Period||99/8/23 → 99/8/25|
Bibliographical noteFunding Information:
This research was supported by Samsung Electronics Co., Ltd.
© 1999 IEEE.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Electronic, Optical and Magnetic Materials