New scan design of asynchronous sequential circuits

Yong Seok Kang, Kyung Hoi Huh, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

In this paper a new scan design for detection of stuck-at faults and delay faults in asynchronous sequential circuits based on the micropipeline approach is proposed. This new scan methodology can gain the high fault coverage of path delay fault as well as stuck-at fault with the small area overhead in the asynchronous micropipeline environments and easily expand the application such as built-in self testing.

Original languageEnglish
Title of host publicationAP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages355-358
Number of pages4
ISBN (Print)0780357051, 9780780357051
DOIs
Publication statusPublished - 1999
Event1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999 - Seoul, Korea, Republic of
Duration: 1999 Aug 231999 Aug 25

Publication series

NameAP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs

Other

Other1st IEEE Asia Pacific Conference on ASICs, AP-ASIC 1999
CountryKorea, Republic of
CitySeoul
Period99/8/2399/8/25

Bibliographical note

Funding Information:
This research was supported by Samsung Electronics Co., Ltd.

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

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