New weight set generation algorithm for weighted random pattern generation

Hangkyu Lee, Sungho Kang

Research output: Contribution to conferencePaper

4 Citations (Scopus)

Abstract

In weighted random pattern testing based on deterministic test patterns, if the number of the deterministic test patterns with a low sampling probability is reduced, the number of the weighted random patterns required to achieve a high fault coverage can be decreased. The weight set that makes the variance of sampling probabilities for deterministic test patterns very small, can reduce the number the deterministic test patterns with a low sampling probability. In this paper, we present a new weight set generation algorithm which can generate high performance weight sets by reducing the variance of the sampling probabilities. Experimental results on ISCAS-85 benchmark circuits prove the effectiveness of the new weight set generation algorithm.

Original languageEnglish
Pages160-165
Number of pages6
Publication statusPublished - 1999 Dec 1
EventInternational Conference on Computer Design (ICCD'99) - Austin, TX, USA
Duration: 1999 Oct 101999 Oct 13

Other

OtherInternational Conference on Computer Design (ICCD'99)
CityAustin, TX, USA
Period99/10/1099/10/13

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Lee, H., & Kang, S. (1999). New weight set generation algorithm for weighted random pattern generation. 160-165. Paper presented at International Conference on Computer Design (ICCD'99), Austin, TX, USA, .