No-reference sharpness metric based on inherent sharpness

S. Ryu, K. Sohn

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)


Proposed is a no-reference sharpness metric that employs the concept of inherent sharpness. It provides a perceptual sharpness score based on wavelet coefficients. The proposed metric is highly correlated with subjective sharpness evaluations and outperforms other state-of-the-art metrics.

Original languageEnglish
Pages (from-to)1178-1180
Number of pages3
JournalElectronics Letters
Issue number21
Publication statusPublished - 2011 Oct 13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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