No-reference sharpness metric based on inherent sharpness

S. Ryu, K. Sohn

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Proposed is a no-reference sharpness metric that employs the concept of inherent sharpness. It provides a perceptual sharpness score based on wavelet coefficients. The proposed metric is highly correlated with subjective sharpness evaluations and outperforms other state-of-the-art metrics.

Original languageEnglish
Pages (from-to)1178-1180
Number of pages3
JournalElectronics Letters
Volume47
Issue number21
DOIs
Publication statusPublished - 2011 Oct 13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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