No-reference sharpness metric based on inherent sharpness

S. Ryu; K. Sohn

doi:10.1049/el.2011.2222

No-reference sharpness metric based on inherent sharpness

S. Ryu, K. Sohn

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

Proposed is a no-reference sharpness metric that employs the concept of inherent sharpness. It provides a perceptual sharpness score based on wavelet coefficients. The proposed metric is highly correlated with subjective sharpness evaluations and outperforms other state-of-the-art metrics.

Original language	English
Pages (from-to)	1178-1180
Number of pages	3
Journal	Electronics Letters
Volume	47
Issue number	21
DOIs	https://doi.org/10.1049/el.2011.2222
Publication status	Published - 2011 Oct 13

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

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10.1049/el.2011.2222

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abstract = "Proposed is a no-reference sharpness metric that employs the concept of inherent sharpness. It provides a perceptual sharpness score based on wavelet coefficients. The proposed metric is highly correlated with subjective sharpness evaluations and outperforms other state-of-the-art metrics.",

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No-reference sharpness metric based on inherent sharpness

Abstract

All Science Journal Classification (ASJC) codes

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