Noise analysis of MREIT at 3T and 11T field strength

R. J. Sadleir, S. C. Grant, S. U. Zhang, S. H. Oh, B. I. Lee, H. C. Pyo, C. J. Park, E. J. Woo, S. Y. Lee, J. K. Seo, O. Kwon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In Magnetic Resonance Electrical Impedance Tomography (MREIT), we measure the induced magnetic flux density inside an imaging object subject to an external injection current. The magnetic flux density is contaminated with noise and this ultimately limits the quality of reconstructed conductivity and current density images. By using two methods to analyze amounts of noise in 3T and 11T MREIT systems, we found that a carefully designed MREIT study will be able to reduce the noise level below 0.1 nT.

Original languageEnglish
Title of host publicationProceedings of the 2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2637-2640
Number of pages4
ISBN (Print)0780387406, 9780780387409
DOIs
Publication statusPublished - 2005
Event2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005 - Shanghai, China
Duration: 2005 Sep 12005 Sep 4

Publication series

NameAnnual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Volume7 VOLS
ISSN (Print)0589-1019

Other

Other2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005
CountryChina
CityShanghai
Period05/9/105/9/4

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Biomedical Engineering
  • Computer Vision and Pattern Recognition
  • Health Informatics

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    Sadleir, R. J., Grant, S. C., Zhang, S. U., Oh, S. H., Lee, B. I., Pyo, H. C., Park, C. J., Woo, E. J., Lee, S. Y., Seo, J. K., & Kwon, O. (2005). Noise analysis of MREIT at 3T and 11T field strength. In Proceedings of the 2005 27th Annual International Conference of the Engineering in Medicine and Biology Society, IEEE-EMBS 2005 (pp. 2637-2640). [1617011] (Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings; Vol. 7 VOLS). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/iembs.2005.1617011