Noise analysis of MREIT at 3T and 11T field strength

R. J. Sadleir, S. C. Grant, S. U. Zhang, S. H. Oh, B. I. Lee, H. C. Pyo, C. J. Park, E. J. Woo, S. Y. Lee, J. K. Seo, O. Kwon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Noise analysis of MREIT at 3T and 11T field strength'. Together they form a unique fingerprint.

Physics