Nondestructive depth profile measurement of a Co/Ti bilayer using refracted x-ray fluorescence

T. A. Roberts, D. H. Ko, K. E. Gray, Y. Y. Wang, R. P.H. Chang, S. Ogawa

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Nondestructive depth profile measurement of a Co/Ti bilayer using refracted x-ray fluorescence'. Together they form a unique fingerprint.

Physics & Astronomy