Nondestructive propagation loss and facet reflectance measurements of GaAs/AlGaAs strip-loaded waveguides

K. H. Park, M. W. Kim, Y. T. Byun, D. Woo, S. H. Kim, S. S. Choi, Y. Chung, W. R. Cho, Seung Han Park, U. Kim

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Abstract

A modified Fabry-Perot resonance technique using a single cavity was proposed to obtain the propagation loss of the optical waveguide. The propagation loss as well as the facet reflectance were measured without sequential cleavage for a GaAs/AlGaAs strip-loaded waveguide based on the contrast ratios of the reflected and transmitted interference patterns.

Original languageEnglish
Pages (from-to)6318-6320
Number of pages3
JournalJournal of Applied Physics
Volume78
Issue number10
DOIs
Publication statusPublished - 1995 Dec 1

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Park, K. H., Kim, M. W., Byun, Y. T., Woo, D., Kim, S. H., Choi, S. S., Chung, Y., Cho, W. R., Park, S. H., & Kim, U. (1995). Nondestructive propagation loss and facet reflectance measurements of GaAs/AlGaAs strip-loaded waveguides. Journal of Applied Physics, 78(10), 6318-6320. https://doi.org/10.1063/1.360729