Abstract
Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.
| Original language | English |
|---|---|
| Pages (from-to) | L9-L13 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 27 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2009 May 18 |
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All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
Cite this
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Nonsinusoidal buckling of thin gold films on elastomeric substrates. / Fei, Huiyang; Jiang, Hanqing; Khang, Dahl Young.
In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 27, No. 3, 18.05.2009, p. L9-L13.Research output: Contribution to journal › Article
TY - JOUR
T1 - Nonsinusoidal buckling of thin gold films on elastomeric substrates
AU - Fei, Huiyang
AU - Jiang, Hanqing
AU - Khang, Dahl Young
PY - 2009/5/18
Y1 - 2009/5/18
N2 - Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.
AB - Buckling of stiff thin films on compliant substrates represents a variety of applications, ranging from stretchable electronics to micro-nanometrology. Different but complementary to previously reported sinusoidal buckling waves, this letter presents a nonsinusoidal surface profile of buckled thin Au films on compliant substrates, specifically, a secondary dip on top of buckling wave or rather broadened wave top with very sharp trough. This nonsinusoidal profile is likely due to tension/compression asymmetry, i.e., different strengths in tension and compression resulted from the polycrystalline, grained microstructure of metal film. Finite element analysis with asymmetric tension/compression material model has reproduced the experiments well qualitatively.
UR - http://www.scopus.com/inward/record.url?scp=65549141323&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=65549141323&partnerID=8YFLogxK
U2 - 10.1116/1.3089244
DO - 10.1116/1.3089244
M3 - Article
AN - SCOPUS:65549141323
VL - 27
SP - L9-L13
JO - Journal of Vacuum Science and Technology A
JF - Journal of Vacuum Science and Technology A
SN - 0734-2101
IS - 3
ER -