TY - GEN
T1 - Nonvolatile ferroelectric polymer memory with controlled hierarchical nanostructures
AU - Kang, S. J.
AU - Park, Y. J.
AU - Park, C.
PY - 2011
Y1 - 2011
N2 - In summary, we demonstrated a novel non-volatile ferroelectric polymer transistor memory operating at low voltage with reliable data retention. The nanometer scale periodic trenches of OS lamellae were prepared using block copolymer self assembly and employed as a gate insulator by hybridizing with PVDF-TrFE. Confined crystallization of PVDF-TrFE in the trenches of OS lamellae not only significantly reduces the gate leakage current but also induces effective crystal orientation that facilitates ferroelectric polarization switching. A FeFET consisting of a 1D ribbon type single crystalline TIPS-PEN as an active channel and a hybrid PVDF-TrFE/OS lamellae gate insulator exhibits I DS hysteresis fully that is saturated at a programming voltage as low as ±8 V, ON/OFF current ratio of ∑10 2, and data retention of ∼2 hours.
AB - In summary, we demonstrated a novel non-volatile ferroelectric polymer transistor memory operating at low voltage with reliable data retention. The nanometer scale periodic trenches of OS lamellae were prepared using block copolymer self assembly and employed as a gate insulator by hybridizing with PVDF-TrFE. Confined crystallization of PVDF-TrFE in the trenches of OS lamellae not only significantly reduces the gate leakage current but also induces effective crystal orientation that facilitates ferroelectric polarization switching. A FeFET consisting of a 1D ribbon type single crystalline TIPS-PEN as an active channel and a hybrid PVDF-TrFE/OS lamellae gate insulator exhibits I DS hysteresis fully that is saturated at a programming voltage as low as ±8 V, ON/OFF current ratio of ∑10 2, and data retention of ∼2 hours.
UR - http://www.scopus.com/inward/record.url?scp=84855275994&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84855275994&partnerID=8YFLogxK
U2 - 10.1109/ISE.2011.6084959
DO - 10.1109/ISE.2011.6084959
M3 - Conference contribution
AN - SCOPUS:84855275994
SN - 9781457710230
T3 - Proceedings - International Symposium on Electrets
SP - 15
EP - 16
BT - 2011 - 14th International Symposium on Electrets, ISE 2011
T2 - 2011 IEEE 14th International Symposium on Electrets, ISE 2011
Y2 - 28 August 2011 through 31 August 2011
ER -