Nonvolatile memory characteristics of solution-processed oxide thin-film transistors using Ag nanoparticles

Jung Hyeon Bae, Gun Hee Kim, Yu Ri Choi, Myung Koo Kang, Dong Lim Kim, Hyun Jae Kim

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

We developed a nonvolatile memory device based on a solution-processed oxide thin-film transistor (TFT) with Ag nanoparticles (NPs) as the charge trapping layer. We fabricated the device using a soluble MgInZnO active channel on a SiO2 gate dielectric, Ag NPs as a charge trapping site at the gate insulator-channel interface, and Al for source and drain electrodes. The transfer characteristics of the device showed a high level of clockwise hysteresis that can be used to demonstrate its memory function, due to electron trapping in the Ag NPs charge trapping layer. A large memory window (ΔVth) was observed with a forward and backward gate voltage sweep, and this memory window was increased in size by increasing the gate voltage sweep. These results show the potential application of memory on displays and disposable electronics.

Original languageEnglish
Pages (from-to)5771-5774
Number of pages4
JournalThin Solid Films
Volume519
Issue number17
DOIs
Publication statusPublished - 2011 Jun 30

Bibliographical note

Funding Information:
This work was supported by the National Research Foundation of Korea (NRF) through the National Research Laboratory Program grant funded by the Korean Ministry of Education, Science and Technology (MEST) [No. R0A-2007-000-10044-0(2007) ].

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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