Notch spatial filtering of image artifacts for structured illumination microscopy of cell-based assays

Jong Ryul Choi, Donghyun Kim

Research output: Contribution to journalArticle

3 Citations (Scopus)


Improvement of structured illumination microscopy (SIM) to remove grid pattern noise was investigated by applying notch spatial filters in the Fourier domain. We have acquired wide-field and SIM images of pollen grains and evaluated multiple reconstruction schemes on a quantitative basis. The results suggest that grid pattern noise can be reduced substantially to be smaller than that of standard SIM by more than 18 times, at the expense of little overhead in the reconstruction time. Also, if notch spatial filters are used in combination with subtractive reconstruction, the overall image quality can be enhanced by almost ten times, compared to standard SIM.

Original languageEnglish
Pages (from-to)142-146
Number of pages5
JournalOptics Communications
Publication statusPublished - 2013 Jul 29


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

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