A novel method is demonstrated for determining the photoelastic effect profile as well as the residual stress profile of an optical fiber for the first time. Measurement results of the residual stress profiles and the photoelastic effect profiles of a B-Ge doped fiber and an Er-Al doped fiber are demonstrated by using this technique with its spatial resolution better than 0.8µm.
|Title of host publication||Optical Fiber Communication Conference, OFC 2001|
|Publisher||Optica Publishing Group (formerly OSA)|
|Publication status||Published - 2001|
|Event||Optical Fiber Communication Conference, OFC 2001 - Anaheim, United States|
Duration: 2001 Mar 17 → …
|Name||Optics InfoBase Conference Papers|
|Conference||Optical Fiber Communication Conference, OFC 2001|
|Period||01/3/17 → …|
Bibliographical notePublisher Copyright:
© 2001 OSA/OFC 2001, © 2000 Optical Society of America.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Mechanics of Materials