Novel technique for measuring the residual stress and the strain-optic coefficient profile of an optical fiber

Y. Park, T. J. Ahn, Y. H. Kim, W. T. Han, U. C. Paek, D. Y. Kim

Research output: Contribution to conferencePaperpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages37-39
Number of pages3
DOIs
Publication statusPublished - 2001
EventConference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States
Duration: 2001 May 62001 May 11

Other

OtherConference on Lasers and Electro-Optics (CLEO)
CountryUnited States
CityBaltimore, MD
Period01/5/601/5/11

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Novel technique for measuring the residual stress and the strain-optic coefficient profile of an optical fiber'. Together they form a unique fingerprint.

Cite this