Abstract
A method for measuring the residual stress profile and stress-optic coefficient profile of an optical fiber was demonstrated. Significant improvement in accuracy and measurement time was obtained by using an analog charge coupled device (CCD) camera and a frame grabber. A fixed polarizer and a linear birefringence device were replaced by a rotating polarizer and a fixed quarter-wave plate adjusted to 45°, in order to control linear birefringence.
| Original language | English |
|---|---|
| Pages | 37-39 |
| Number of pages | 3 |
| Publication status | Published - 2001 Oct 8 |
| Event | Conference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States Duration: 2001 May 6 → 2001 May 11 |
Other
| Other | Conference on Lasers and Electro-Optics (CLEO) |
|---|---|
| Country | United States |
| City | Baltimore, MD |
| Period | 01/5/6 → 01/5/11 |
All Science Journal Classification (ASJC) codes
- Control and Systems Engineering
- Electrical and Electronic Engineering
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Park, Y., Ahn, T. J., Kim, Y. H., Han, W. T., Paek, U. C., & Kim, D. Y. (2001). Novel technique for measuring the residual stress and the strain-optic coefficient profile of an optical fiber. 37-39. Paper presented at Conference on Lasers and Electro-Optics (CLEO), Baltimore, MD, United States.