Novel technique for measuring the residual stress and the strain-optic coefficient profile of an optical fiber

Y. Park, T. J. Ahn, Y. H. Kim, W. T. Han, U. C. Paek, D. Y. Kim

Research output: Contribution to conferencePaper

2 Citations (Scopus)
Original languageEnglish
Pages37-39
Number of pages3
DOIs
Publication statusPublished - 2001
EventConference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States
Duration: 2001 May 62001 May 11

Other

OtherConference on Lasers and Electro-Optics (CLEO)
CountryUnited States
CityBaltimore, MD
Period01/5/601/5/11

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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    Park, Y., Ahn, T. J., Kim, Y. H., Han, W. T., Paek, U. C., & Kim, D. Y. (2001). Novel technique for measuring the residual stress and the strain-optic coefficient profile of an optical fiber. 37-39. Paper presented at Conference on Lasers and Electro-Optics (CLEO), Baltimore, MD, United States. https://doi.org/10.1109/cleo.2001.947433