Novel technique for measuring the residual stress and the strain-optic coefficient profile of an optical fiber

Y. Park, T. J. Ahn, Y. H. Kim, W. T. Han, U. C. Paek, Dug Young Kim

Research output: Contribution to conferencePaper

2 Citations (Scopus)

Abstract

A method for measuring the residual stress profile and stress-optic coefficient profile of an optical fiber was demonstrated. Significant improvement in accuracy and measurement time was obtained by using an analog charge coupled device (CCD) camera and a frame grabber. A fixed polarizer and a linear birefringence device were replaced by a rotating polarizer and a fixed quarter-wave plate adjusted to 45°, in order to control linear birefringence.

Original languageEnglish
Pages37-39
Number of pages3
Publication statusPublished - 2001 Oct 8
EventConference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States
Duration: 2001 May 62001 May 11

Other

OtherConference on Lasers and Electro-Optics (CLEO)
CountryUnited States
CityBaltimore, MD
Period01/5/601/5/11

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All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Park, Y., Ahn, T. J., Kim, Y. H., Han, W. T., Paek, U. C., & Kim, D. Y. (2001). Novel technique for measuring the residual stress and the strain-optic coefficient profile of an optical fiber. 37-39. Paper presented at Conference on Lasers and Electro-Optics (CLEO), Baltimore, MD, United States.